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IEC 60747-4-1:2000

Withdrawn
Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Semiconductor devices - Discrete devices - Part 4-1: Microwave diodes and transistors - Microwave field effect transistors - Blank detail specification
Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Withdrawn date

31-12-2021

Language(s)

English

Published date

16-06-2000

FOREWORD
INTRODUCTION
1 Mechanical description
2 Short description
3 Categories of assessed quality
4 Limiting values (absolute maximum rating system)
   common to all applications
5 Electrical characteristics
6 Marking
7 Ordering information
8 Test conditions and inspection requirements
9 Group D - Qualification approval tests
10 Additional information (not for inspection purposes)
Annex A (normative) Field-effect transistors

Defines quality assessment procedures in such a manner that electronic components that are released by one participating country as conforming with the requirements of an applicable specification are acceptable equally in all other countries that participate without need for testing further.

DocumentType
Standard
Pages
17
PublisherName
International Electrotechnical Committee
Status
Withdrawn

Standards Relationship
BS QC750115(2000) : 2000 Identical
BS IEC 60747-4.1 : 2000 Identical
NEN IEC 60747-4-1 : 2000 Identical
BS IEC 60747-4-1:2000 Identical

IEC 60747-8-1:1987 Semiconductor devices - Discrete devices - Part 8: Field-effecttransistors - Section One: Blank detail specification forsingle-gate field-effect transistors up to 5 W and 1 GHz
IEC 60747-10:1991 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
IEC 60191-2:2012 DB Mechanical standardization of semiconductor devices - Part 2: Dimensions
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
IEC 60747-11:1985 Semiconductor devices. Discrete devices. Part 11: Sectionalspecification for discrete devices

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$281.73
Including GST where applicable

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