Semiconductor devices - Integrated circuits - Part 23-3: Hybrid integrated circuits and film structures - Manufacturing line certification - Manufacturers' self-audit checklist and report

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

17-05-2002

Publisher

International Electrotechnical Committee

Applies to a high quality approval system for hybrid integrated circuits and film structures.This checklist is intended for the use of a hybrid microcircuit manufacturer's internal assessment team. It will provide the hybrid manufacturer and the National Supervising Inspectorate with ongoing information on process control demonstrating compliance with IEC 60748-23-1.

Committee	TC 47/SC 47A
DevelopmentNote	To be read in conjunction with IEC 60748-23-1, IEC 60748-23-2 and IEC 60748-23-4. (05/2002) Supersedes IEC 60186B. (07/2004) Stability Date: 2021. (11/2017)
DocumentType	Standard
Pages	78
PublisherName	International Electrotechnical Committee
Status	Current
Supersedes	IEC 60148B:1979

Standards	Relationship
BS IEC 60748-23-3:2002	Identical
NEN IEC 60748-23-3 : 2002	Identical

IEC 60748-23-2:2002	Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests
BS IEC 60748-23-1:2002	Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Generic specification
BS IEC 60748-23-4:2002	Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Blank detail specification
IEC 60748-23-4:2002	Semiconductor devices - Integrated circuits - Part 23-4: Hybrid integrated circuits and film structures - Manufacturing line certification - Blank detail specification
BS IEC 60748-23-2:2002	Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Internal visual inspection and special tests
IEC 60748-23-1:2002	Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification

IEC 60068-2-20:2008	Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
IECQ 001002-3:2005	IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES
IEC 61340-5-1:2016	Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements
IEC 60748-23-1:2002	Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification
IEC 60748-23-4:2002	Semiconductor devices - Integrated circuits - Part 23-4: Hybrid integrated circuits and film structures - Manufacturing line certification - Blank detail specification
IEC 60748-1:2002	Semiconductor devices - Integrated circuits - Part 1: General
IEC 60748-23-2:2002	Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests

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IEC 60748-23-3:2002

Semiconductor devices - Integrated circuits - Part 23-3: Hybrid integrated circuits and film structures - Manufacturing line certification - Manufacturers' self-audit checklist and report

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