Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French, Spanish, Castilian

Published date

07-08-2003

Publisher

International Electrotechnical Committee

FOREWORD
1 Scope
2 Normative references
3 General
4 Test condition A - Tension
5 Test condition B - Bending stress
6 Test condition C - Lead fatigue
7 Test condition D - Lead torque
8 Test condition E - Stud torque

Provides various tests for determining the integrity between the lead/package interface and the lead itself when the lead(s) are bent due to faulty board assembly followed by rework of the part for re-assembly.Applicable to all through-hole devices and surface-mount devices requiring lead forming by the user.

Committee	TC 47
DevelopmentNote	Supersedes IEC PAS 62184. (08/2003) Supersedes IEC 60749. (03/2008) Stability Date: 2021. (11/2017)
DocumentType	Standard
Pages	27
PublisherName	International Electrotechnical Committee
Status	Current
Supersedes	IEC PAS 62184:2000 IEC 60749:1996+AMD1:2000+AMD2:2001 CSV

Standards	Relationship
PN EN 60749-14 : 2005	Identical
BS EN 60749-14:2003	Identical
UNE-EN 60749-14:2004	Identical
CEI EN 60749-14 : 2004	Identical
I.S. EN 60749-14:2003	Identical
NF EN 60749-14 : 2004	Identical
EN 60749-14:2003	Identical
NEN EN IEC 60749-14 : 2003	Identical
DIN EN 60749-14:2004-07	Identical
BS EN 60068-2-13:1999	Identical

CEI EN 60749-13 : 2004	SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE
CEI EN 61747-10-1 : 2014	LIQUID CRYSTAL DISPLAY DEVICES - PART 10-1: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - MECHANICAL
I.S. EN 60749-13:2002	SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE
BS EN 62922:2017	Organic light emitting diode (OLED) panels for general lighting. Performance requirements
I.S. EN 61747-10-1:2013	LIQUID CRYSTAL DISPLAY DEVICES - PART 10-1: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - MECHANICAL (IEC 61747-10-1:2013 (EQV))
EN 62922:2017	Organic light emitting diode (OLED) panels for general lighting - Performance Requirements
07/30162213 DC : 0	BS EN 60747-15 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES
BS EN 61747-10-1:2013	Liquid crystal display devices Environmental, endurance and mechanical test methods. Mechanical
BS EN 60749-13:2002	Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
I.S. EN 62922:2017	ORGANIC LIGHT EMITTING DIODE (OLED) PANELS FOR GENERAL LIGHTING - PERFORMANCE REQUIREMENTS
IEC 61747-10-1:2013	Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods - Mechanical
13/30264591 DC : 0	BS EN 60747-14-6 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-6: SEMICONDUCTOR SENSORS - HUMIDITY SENSOR
13/30264600 DC : 0	BS EN 60747-14-8 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-8: SEMICONDUCTOR SENSORS - CAPACITIVE DEGRADATION SENSOR OF LIQUID
I.S. EN IEC 60749-13:2018	SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE
IEC TS 62686-1:2015	Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
IEC 60749-13:2018	Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
IEC 61747-3-1:2015	Liquid crystal display devices - Part 3-1: Liquid crystal display (LCD) cells - Blank detail specification
PD IEC/TS 62686-1:2015	Process management for avionics. Electronic components for aerospace, defence and high performance (ADHP) applications General requirements for high reliability integrated circuits and discrete semiconductors
EN IEC 60749-13:2018	Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
13/30264596 DC : 0	BS EN 60747-14-7 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-7: SEMICONDUCTOR SENSORS - FLOW METER
IEC 60747-5-6:2016	Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
IEC 62922:2016	Organic light emitting diode (OLED) panels for general lighting - Performance requirements
EN 61747-10-1:2013	Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods – Mechanical
EN 60749-13:2002	Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

IEC 60749-8:2002

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

View more information

$131.91

Including GST where applicable

Product format

I agree to the DRM document license rules apply against the PDF selection made.

Please confirm that you agree to the document license rules for this document.

I agree to the document license rules .

Please confirm that you agree to the document license rules for this document.

Access your standards online with a subscription

Features

Simple online access to standards, technical information and regulations.
Critical updates of standards and customisable alerts and notifications.
Multi-user online standards collection: secure, flexible and cost effective.

Learn more on subscription solutions

Get in touch with us

Log into your Account

IEC 60749-14:2003

Current

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referenced By This Book

Standards Referencing This Book

Category

Subcategory

Access your standards online with a subscription