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IEC 60749:1984

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Semiconductor devices - Mechanical and climatic test methods.
Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

09-03-2020

Published date

30-12-1984

Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made.Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.

Committee
TC 47
DocumentType
Standard
Pages
123
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

Standards Relationship
AS 2547.3.1-1986 Identical
UNE 20699:1992 Identical

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$358.06
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