Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French, Spanish, Castilian

Published date

13-02-2003

Publisher

International Electrotechnical Committee

Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

Committee	TC 47
DevelopmentNote	Supersedes IEC 60749. (03/2008) Stability Date: 2021. (11/2017)
DocumentType	Standard
Pages	7
PublisherName	International Electrotechnical Committee
Status	Current
Supersedes	IEC 60749:1996+AMD1:2000+AMD2:2001 CSV

Standards	Relationship
NF EN 60749-36 : 2003	Identical
NEN EN IEC 60749-36 : 2003	Identical
I.S. EN 60749-36:2003	Identical
PN EN 60749-36 : 2005	Identical
SN EN 60749-36 : 2003	Identical
UNE-EN 60749-36:2004	Identical
BS EN 60749-36:2003	Identical
CEI EN 60749-36 : 2004	Identical
EN 60749-36:2003	Identical
DIN EN 60749-36:2003-12	Identical

17/30355772 DC : 0	BS EN 62047-33 ED.1.0 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 33: MEMS PIEZORESISTIVE PRESSURE-SENSITIVE DEVICE
13/30264591 DC : 0	BS EN 60747-14-6 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-6: SEMICONDUCTOR SENSORS - HUMIDITY SENSOR
BS IEC 60747-14-5:2010	Semiconductor devices Semiconductor sensors. PN-junction semiconductor temperature sensor
07/30162213 DC : 0	BS EN 60747-15 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES
07/30172155 DC : DRAFT OCT 2007	BS EN 62047-5 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 5: RF MEMS SWITCHES
IEC 60747-14-5:2010	Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
IEC TS 62686-1:2015	Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
PD IEC/TS 62686-1:2015	Process management for avionics. Electronic components for aerospace, defence and high performance (ADHP) applications General requirements for high reliability integrated circuits and discrete semiconductors
07/30164953 DC : 0	IEC 60747-14-5 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 14-5: SEMICONDUCTOR SENSORS - PN-JUNCTION SEMICONDUCTOR TEMPERATURE SENSOR
13/30264596 DC : 0	BS EN 60747-14-7 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-7: SEMICONDUCTOR SENSORS - FLOW METER
13/30264600 DC : 0	BS EN 60747-14-8 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-8: SEMICONDUCTOR SENSORS - CAPACITIVE DEGRADATION SENSOR OF LIQUID
IEC 60747-5-6:2016	Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

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IEC 60749-36:2003

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referenced By This Book

Category

Subcategory