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IEC 62149-2:2014

Current
Current

The latest, up-to-date edition.

Fibre optic active components and devices - Performance standards - Part 2: 850 nm discrete vertical cavity surface emitting laser devices
Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

26-05-2014

Publisher

International Electrotechnical Committee

IEC 62149-2:2014 covers the performance specification for 850-nm discrete vertical cavity surface emitting laser (VCSEL) devices of transverse multimode types used for fibre optic telecommunication and optical data transmission applications. The performance standard contains a definition of the product performance requirements together with a series of sets of tests and measurements with clearly defined conditions, severities, and pass/fail criteria. The tests are intended to be run on a "once-off" basis to prove any product's ability to satisfy the performance standard's requirements. This second edition cancels and replaces the first edition published in 2009 and constitutes a technical revision. The significant technical changes with respect to the previous edition include the introduction of the performance standards for 10 Gbit/s 850-nm wavelength, vertical cavity surface emitting laser (VCSEL) devices and the deletion of the package diagrams and pin configurations in Clause A.4 and Clause B.4 by citing the VCSEL package standard IEC 62148-15 instead. Keywords: 850-nm discrete vertical cavity surface emitting laser (VCSEL) devices, transverse multimode types

Committee
TC 86/SC 86C
DevelopmentNote
Stability Date: 2019. (05/2014)
DocumentType
Standard
Pages
40
PublisherName
International Electrotechnical Committee
Status
Current
Supersedes

I.S. EN 62148-15:2014 FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PACKAGE AND INTERFACE STANDARDS - PART 15: DISCRETE VERTICAL CAVITY SURFACE EMITTING LASER PACKAGES
13/30277884 DC : 0 BS EN 62148-15 ED 2.0 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PACKAGE AND INTERFACE STANDARDS - PART 15: DISCRETE VERTICAL CAVITY SURFACE EMITTING LASER PACKAGES
07/30162143 DC : 0 BS EN 62148-15 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PACKAGE AND INTERFACE STANDARDS - PART 15: DISCRETE VERTICAL CAVITY SURFACE EMITTING LASER PACKAGES
BS EN 62148-15:2014 Fibre optic active components and devices. Package and interface standards Discrete vertical cavity surface emitting laser packages
IEC 62148-15:2014 Fibre optic active components and devices - Package and interface standards - Part 15: Discrete vertical cavity surface emitting laser packages
EN 62148-15:2014 Fibre optic active components and devices - Package and interface standards - Part 15: Discrete vertical cavity surface emitting laser packages

IEC 60950-1:2005+AMD1:2009+AMD2:2013 CSV Information technology equipment - Safety - Part 1: General requirements
IEC 62148-15:2014 Fibre optic active components and devices - Package and interface standards - Part 15: Discrete vertical cavity surface emitting laser packages
IEC GUIDE 107:2014 Electromagnetic compatibility - Guide to the drafting of electromagnetic compatibility publications
IEC 61280-1-3:2010 Fibre optic communication subsystem test procedures - Part 1-3: General communication subsystems - Central wavelength and spectral width measurement
IEC 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
IEC 60749-25:2003 Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
IEC 61300-2-48:2009 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cycling
IEC 60749-11:2002 Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
IEC 60825-1:2014 Safety of laser products - Part 1: Equipment classification and requirements
IEC 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
IEC 60749-26:2013 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
IEC 60749-7:2011 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
IEC 60749-6:2017 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
IEC 62148-1:2017 Fibre optic active components and devices - Package and interface standards - Part 1: General and guidance
IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
IEC 61300-2-4:1995 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests - Fibre/cable retention
IEC 60749-10:2002 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
IEC 62149-1:2011 Fibre optic active components and devices - Performance standards - Part 1: General and guidance
IEC 61300-2-19:2012 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-19: Tests - Damp heat (steady state)
IEC 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

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Hardcopy - English - French
PDF 1 User - English - French
PDF 3 Users - English - French
PDF 5 Users - English - French
PDF 9 Users - English - French
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