Polymeric thermistors - Directly heated positive step function temperature coefficient - Part 1: Generic specification

Amended by

IEC 62319-1:2005/COR1:2009

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Published date

15-02-2005

Publisher

International Electrotechnical Committee

IEC 62319-1:2005(E) prescribes terms and methods of test for polymeric positive temperature coefficient thermistors, insulated and non-insulated types, typically intended for use in current limiting and overcurrent protection applications. It establishes standard terms, inspection procedures and methods of test for use in detail specifications for Qualification Approval and for Quality Assessment Systems for electronic components. The contents of the corrigendum of March 2009 have been included in this copy.

DevelopmentNote	Stability Date: 2016. (10/2012)
DocumentType	Standard
Pages	33
PublisherName	International Electrotechnical Committee
Status	Current

Standards	Relationship
NEN EN IEC 62319-1 : 2005 C1 2009	Identical
I.S. EN 62319-1:2005	Identical
PN EN 62319-1 : 2005	Identical
VDE 0898-1 : 2005 COR 1 2009	Identical
DIN EN 62319-1 : 2005 COR 1 2009	Identical
BS EN 62319-1:2005	Identical
CEI EN 62319-1 : 2005	Identical
EN 62319-1:2005	Identical
NF EN 62319-1 : 2005	Identical
UNE-EN 62319-1:2005	Identical

BS EN 62319-1-1:2005	Polymeric thermistors. Directly heated positive step function temperature coefficient Blank detail specification. Current limiting application
I.S. EN 62319-1-1:2005	POLYMERIC THERMISTORS - DIRECTLY HEATED POSITIVE STEP FUNCTION TEMPERATURE COEFFICIENT - PART 1-1: BLANK DETAIL SPECIFICATION CURRENT LIMITING APPLICATION
CEI EN 62319-1-1 : 2005	POLYMERIC THERMISTORS - DIRECTLY HEATED POSITIVE STEP FUNCTION TEMPERATURE COEFFICIENT - PART 1-1: BLANK DETAIL SPECIFICATION - CURRENT LIMITING APPLICATION
IEC 62319-1-1:2005	Polymeric thermistors - Directly heated positive step function temperature coefficient - Part 1-1: Blank detail specification - Current limiting application
IEEE C62.39-2012	IEEE Standard for Test Methods and Preferred Values for Self-Restoring Current-Limiter Components Used in Telecommunication Surge Protection
NF EN 62319-1-1 : 2005	POLYMERIC THERMISTORS - DIRECTLY HEATED POSITIVE STEP FUNCTION TEMPERATURE COEFFICIENT - PART 1-1: BLANK DETAIL SPECIFICATION - CURRENT LIMITING APPLICATION
EN 62319-1-1:2005	Polymeric thermistors - Directly heated positive step function temperature coefficient - Part 1-1: Blank detail specification - Current limiting application

IEC 60068-1:2013	Environmental testing - Part 1: General and guidance
IEC 60068-2-27:2008	Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60068-2-20:2008	Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
IECQ 001003:1998	IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - GUIDANCE DOCUMENTS
IECQ 001002-3:2005	IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES
IEC 60068-2-21:2006	Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60027-1:1992	Letters symbols to be used in electrical technology - Part 1: General
IEC 60410:1973	Sampling plans and procedures for inspection by attributes
IEC 60294:2012	Measurement of the dimensions of a cylindrical component with axial terminations
IEC 60068-2-29:1987	Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
IEC 60068-2-14:2009	Environmental testing - Part 2-14: Tests - Test N: Change of temperature

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IEC 62319-1:2005

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