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IEC 62396-4:2013

Current

Current

The latest, up-to-date edition.

Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects

Published date

25-09-2013

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Potential high voltage single event effects
5 Quantifying single event burnout in avionics
  for high voltage devices
6 Relevant SEB data and applying it to avionics
7 Conclusion
Bibliography

IEC 62396-4:2013(E) provides guidance on atmospheric radiation effects and their management on high voltage (nominally above 200 V) avionics electronics used in aircraft operating at altitudes up to 60 000 ft (18,3 km). This part of IEC 62396 defines the effects of that environment on high voltage electronics and provides design considerations for the accommodation of those effects within avionics systems. This part of IEC 62396 provides technical data and methodology for aerospace equipment manufacturers and designers to standardise their approach to single event effects on high voltage avionics by providing guidance, leading to a standard methodology.

This publication is to be read in conjunction with IEC 62396-1:2012.

Committee
TC 107
DevelopmentNote
Supersedes IEC TS 62396-4. To be read in conjunction with IEC 62396-1. Stability date: 2016. (09/2013)
DocumentType
Standard
PublisherName
International Electrotechnical Committee
Status
Current
Supersedes

Standards Relationship
BS IEC 62396-4:2013 Identical

IEC 62396-1:2016 Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
BS IEC 62396-5:2014 Process management for avionics. Atmospheric radiation effects Assessment of thermal neutron fluxes and single event effects in avionics systems
IEC 62396-5:2014 Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems
BS IEC 62396-2:2017 Process management for avionics. Atmospheric radiation effects Guidelines for single event effects testing for avionics systems
BS EN 60749-44:2016 Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
IEC 62396-1 REDLINE : 2ED 2016 PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT
IEC TR 62396-6:2017 Process management for avionics - Atmospheric radiation effects - Part 6: Extreme space weather - Potential impact on the avionics environment and electronics
BIS IS/IEC 61558-2-6 : 1ED 2016 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES
17/30352610 DC : 0 BS IEC 62396-2 ED2.0 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 2: GUIDELINES FOR SINGLE EVENT EFFECTS TESTING FOR AVIONICS SYSTEMS
IEC 62396-2:2017 Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
IEC TS 62239-1:2015 Process management for avionics - Management plan - Part 1: Preparation and maintenance of an electronic components management plan
EIA STD 4899 : 2017-05 REQUIREMENTS FOR AN ELECTRONIC COMPONENTS MANAGEMENT PLAN
EIA 933 : 2015 REQUIREMENTS FOR A COTS ASSEMBLY MANAGEMENT PLAN
IEC TR 62396-7:2017 Process management for avionics - Atmospheric radiation effects - Part 7: Management of single event effects (SEE) analysis process in avionics design
14/30299002 DC : 0 BS EN 60749-44 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES
PD IEC/TR 62396-7:2017 Process management for avionics. Atmospheric radiation effects Management of single event effects (SEE) analysis process in avionics design
17/30365636 DC : 0 BS EN 62239-1 ED.1.0 - PROCESS MANAGEMENT FOR AVIONICS - MANAGEMENT PLAN - PART 1: PREPARATION AND MAINTENANCE OF AN ELECTRONIC COMPONENTS MANAGEMENT PLAN
PD IEC/TS 62239-1:2015 Process management for avionics. Management plan Preparation and maintenance of an electronic components management plan
PD IEC/TR 62396-6:2017 Process management for avionics. Atmospheric radiation effects Extreme space weather. Potential impact on the avionics environment and electronics
EN 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
IEC 62396-1:2016 RLV Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment

IEC 62396-1:2016 Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment

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