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IEC 62396-5:2014

Current
Current

The latest, up-to-date edition.

Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems
Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

22-08-2014

Publisher

International Electrotechnical Committee

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Overview of thermal neutron single event
  rate calculation
5 Thermal neutron flux inside an airliner
6 Thermal neutron SEU cross-sections
7 Recommendation for devices in avionics at
  the present time
8 Determining thermal neutron SEE rates for use
  in equipment assessments
9 Single event burn out in high voltage devices due
  to thermal neutrons
Bibliography

IEC 62396-5:2014(E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. IEC 62396-5 addresses two main items:
- a detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners, and
- an enhanced compilation of the thermal neutron SEU cross-section in currently available SRAM devices (more than 20 different devices). The net result of the reviews of these two different sets of data will be two ratios that are considered to be very important for leading to the ultimate objective of determining how large a threat is. This new edition includes the following technical changes with respect to the previous technical specification: document upgraded to an IEC international standard, change to title, updated references and bibliography, consideration of smaller geometries, addition of recent data on neutron cross-sections, etc.

Committee
TC 107
DevelopmentNote
Supersedes IEC TS 62396-5. Stability date: 2017. (08/2014)
DocumentType
Standard
ISBN
978-2-8322-1821-1
Pages
21
PublisherName
International Electrotechnical Committee
Status
Current
Supersedes

Standards Relationship
BS IEC 62396-5:2014 Identical

IEC 62396-1:2016 Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
BS IEC 62396-2:2017 Process management for avionics. Atmospheric radiation effects Guidelines for single event effects testing for avionics systems
BS EN 60749-44:2016 Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
IEC 62396-1 REDLINE : 2ED 2016 PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT
IEC TR 62396-6:2017 Process management for avionics - Atmospheric radiation effects - Part 6: Extreme space weather - Potential impact on the avionics environment and electronics
BIS IS/IEC 61558-2-6 : 1ED 2016 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES
17/30352610 DC : 0 BS IEC 62396-2 ED2.0 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 2: GUIDELINES FOR SINGLE EVENT EFFECTS TESTING FOR AVIONICS SYSTEMS
IEC 62396-2:2017 Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
IEC TS 62239-1:2015 Process management for avionics - Management plan - Part 1: Preparation and maintenance of an electronic components management plan
EIA STD 4899 : 2017-05 REQUIREMENTS FOR AN ELECTRONIC COMPONENTS MANAGEMENT PLAN
EIA 933 : 2015 REQUIREMENTS FOR A COTS ASSEMBLY MANAGEMENT PLAN
IEC TR 62396-7:2017 Process management for avionics - Atmospheric radiation effects - Part 7: Management of single event effects (SEE) analysis process in avionics design
PD IEC/TR 62396-7:2017 Process management for avionics. Atmospheric radiation effects Management of single event effects (SEE) analysis process in avionics design
17/30365636 DC : 0 BS EN 62239-1 ED.1.0 - PROCESS MANAGEMENT FOR AVIONICS - MANAGEMENT PLAN - PART 1: PREPARATION AND MAINTENANCE OF AN ELECTRONIC COMPONENTS MANAGEMENT PLAN
PD IEC/TS 62239-1:2015 Process management for avionics. Management plan Preparation and maintenance of an electronic components management plan
PD IEC/TR 62396-6:2017 Process management for avionics. Atmospheric radiation effects Extreme space weather. Potential impact on the avionics environment and electronics
IEC 62396-1:2016 RLV Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
EN 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

IEC 62396-1:2012 Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
IEC 62396-4:2013 Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects
IEC 62396-1:2016 Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment

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Hardcopy - English
PDF 1 User - English
PDF 3 Users - English
PDF 5 Users - English
PDF 9 Users - English
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