Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format

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Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

28-08-2015

Publisher

International Electrotechnical Committee

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviations
4 General syntax rules and guidelines
Annex A (informative) - Example files
Annex B (normative) - Valid keywords
Annex C (normative) - Keyword usage rules
Bibliography

IEC TR 61967-1-1:2015(E) provides guidance for exchanging data generated by near-field scan measurements. The described exchange format could also be used for near-field scan data generated by simulation or computation software. It should be noted that, although it has been developed for near-field scan, its use is not restricted to this application. The exchange format can be applied to emission and immunity near-field scan data in the frequency and time domains. The scope of this technical report includes neither the methods used for the measurements or simulations, nor the software and algorithms used for generating the exchange file or for processing or viewing the data contained therein. This edition includes the following significant changes with respect to the previous edition:
- Addition of: 3D objects; Binary data files; Piece-wise linear time domain and frequency domain data; Vectors permitting rotation and offset of measurement and DUT reference planes; Transducer gain and probe factor can be complex; New keywords: Object3d, Mapobj, Maxhold, Datafileformat, Vx, Vy, Vz, Target, Software, Data_source.
- Updating of: Probe factor and corresponding keywords.
- Modification of: Keywords: Average.

Committee	TC 47/SC 47A
DevelopmentNote	Stability Date: 2020. (09/2015)
DocumentType	Technical Report
Pages	63
PublisherName	International Electrotechnical Committee
Status	Current
Supersedes	IEC TR 61967-1-1:2010

Standards	Relationship
PD IEC/TR 61967-1-1:2015	Identical
NEN NPR IEC/TR 61967-1-1 : 2015	Identical
BS EN 61850-7-3:2011	Identical

PD IEC/TS 61967-3:2014	Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. Surface scan method
PD IEC/TS 62132-9:2014	Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. Surface scan method
IEC TS 61967-3:2014	Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
IEC TS 62132-9:2014	Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method

IEC 60050-131:2002	International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory
IEC TS 62132-9:2014	Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
IEC 61967-1:2002	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC TS 61967-3:2014	Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
IEC 62132-1:2015	Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
ISO 8879:1986	Information processing Text and office systems Standard Generalized Markup Language (SGML)
IEEE 754-2008 REDLINE	IEEE Standard for Floating-Point Arithmetic

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IEC TR 61967-1-1:2015

Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format

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