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IEC TR 62258-3:2010

Current
Current

The latest, up-to-date edition.

Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage
Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English, English - French, Russian

Published date

06-08-2010

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Handling - Good practice
5 Process handling issues
6 Die and wafer transport and storage media
7 Storage good practice
8 Traceability good practice
9 Guidelines for long-term storage (die banking) of
   bare die and wafers
10 Good practice for automated handling during
   assembly
Annex A (informative) - Planning checklist
Annex B (informative) - Material specifications
Bibliography

IEC/TR 62258-3:2010 has been developed to facilitate the production, supply and use of semiconductor die products, including:
- wafers,
- singulated bare die,
- die and wafers with attached connection structures,
- and minimally or partially encapsulated die and wafers. This report contains suggested good practice for the handling, packing and storage of die products. Success in manufacture of electronic assemblies containing die products is enhanced by attention to handling, storage and environmental conditions. This report provides guidelines taken from industry experience and is especially useful to those integrating die products into assemblies for the first time. It is also intended as an aid to setting up and auditing facilities that handle or use bare die products, from wafer fabrication to final assembly. This edition includes the following significant technical changes with respect to the previous edition.
1. Special requirements have been added throughout the document for optical die, where applicable. For example see 4.3 paragraph 4 and 10.1.3 paragraph 3.
2. The following new subclauses have been added:
- 4.4.6 ESD Guidelines
- 5.1 Wafer thinning
3. Subclause 5.2 (Singulation or die separation) has been renamed from the previous Subclause 5.1 (Wafer sawing) and has been expanded to included other methods of singulation or sawing, including:
- 5.2.2 Wafer scribing
- 5.2.3 Laser cutting
- 5.2.4 Dice before grind (DBG)
4. Subclause 5.3.7 (previous edition Subclause 5.2.7) has been changed to include optical and microwave die.
5. In Subclause 6.3, the Subclause 6.3.2 (Specialised wafer tubs) has been added to include wafer taubs specially handle and ship wafers that have not been singulated.
6. Two new Subclauses have been to Clause 6:
- 6.9 Handling and packing of thinned die or wafers
- 6.10 Packing materials and their reuse
7. A new subclause has been added to Subclause 9.6:
- 9.6.3 Use of packing material having sacrificial properties
8. Annex A (Planning checklist) has been updated throughout.
9. In Annex B (Material specifications) a new Subclause has been added:
- B.5 Adhesive gel tray material specifications.

Committee
TC 47
DevelopmentNote
Stability Date: 2020. (09/2017)
DocumentType
Technical Report
Pages
114
PublisherName
International Electrotechnical Committee
Status
Current
Supersedes

BS EN 62258-1:2010 Semiconductor die products Procurement and use
I.S. EN 62258-1:2010 SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE
EN 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
CLC/TS 50466:2006 Long duration storage of electronic components - Specification for implementation
EN 62435-1:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
EN 62258-1:2010 Semiconductor die products - Part 1: Procurement and use
I.S. EN 62435-1:2017 ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 1: GENERAL
I.S. CLC TS 50466:2006 LONG DURATION STORAGE OF ELECTRONIC COMPONENTS - SPECIFICATION FOR IMPLEMENTATION
I.S. EN 62435-5:2017 ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 5: DIE AND WAFER DEVICES
CEI CLC/TS 50466 : 2006 LONG DURATION STORAGE OF ELECTRONIC COMPONENTS - SPECIFICATION FOR IMPLEMENTATION
I.S. EN 62435-2:2017 ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 2: DETERIORATION MECHANISMS
IEC 62435-4:2018 Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage
09/30214337 DC : 0 BS EN 60286-3 - PACKAGING OF COMPONENTS FOR AUTOMATIC HANDLING - PART 3: PACKAGING OF SURFACE MOUNT COMPONENTS ON CONTINUOUS TAPES
I.S. EN 60286-3:2013 PACKAGING OF COMPONENTS FOR AUTOMATIC HANDLING - PART 3: PACKAGING OF SURFACE MOUNT COMPONENTS ON CONTINUOUS TAPES (IEC 60286-3:2013 (EQV))
BS EN 62435-2:2017 Electronic components. Long-term storage of electronic semiconductor devices Deterioration mechanisms
DD CLC/TS 50466:2006 Long duration storage of electronic components. Specification for implementation
BS EN 60286-3:2013 Packaging of components for automatic handling Packaging of surface mount components on continuous tapes
IEC 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
IEC 62435-2:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
IEC 60286-3:2013 Packaging of components for automatic handling - Part 3: Packaging of surface mount components on continuous tapes
BS EN 62435-5:2017 Electronic components. Long-term storage of electronic semiconductor devices Die and wafer devices
BS EN 62435-1:2017 Electronic components. Long-term storage of electronic semiconductor devices General
05/30139061 DC : DRAFT SEP 2005 IEC 60286-3 - PACKING OF COMPONENTS FOR AUTOMATIC HANDLING - PART 3: PACKING OF SURFACE MOUNT COMPONENTS ON CONTINUOUS TAPES
IEC 62258-1:2009 Semiconductor die products - Part 1: Procurement and use
CEI EN 62258-1 : 2011 SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE
EN 60286-3:2013/AC:2013 PACKAGING OF COMPONENTS FOR AUTOMATIC HANDLING - PART 3: PACKAGING OF SURFACE MOUNT COMPONENTS ON CONTINUOUS TAPES (IEC 60286-3:2013)
EN 62435-2:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

IEC 61340-5-1:2016 Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements
IEC 62258-1:2009 Semiconductor die products - Part 1: Procurement and use
IEC TR 61340-5-2:2007 Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide
IEC 62258-2:2011 Semiconductor die products - Part 2: Exchange data formats
ISO 14644-1:2015 Cleanrooms and associated controlled environments Part 1: Classification of air cleanliness by particle concentration
IEC 60286-3:2013 Packaging of components for automatic handling - Part 3: Packaging of surface mount components on continuous tapes

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