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IEEE 1671.1-2009

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions
Available format(s)

PDF

Superseded date

11-12-2013

Language(s)

English

Published date

11-12-2009

Publisher

Institute of Electrical & Electronics Engineers

1. Overview
2. Normative references
3. Definitions, acronyms, and abbreviations
4. Test Description schema
5. Describing test program structure
6. Describing control flow
7. Describing data
8. Describing test behavior
9. Describing fault isolation
10. ATML Test Description XML schema names and
    locations
11. ATML XML schema extensibility
12. Conformance
Annex A (normative) - XML schemas
Annex B (informative) - TSF library examples
Annex C (informative) - Describing digital testing
Annex D (informative) - Describing serial digital bus exchanges
Annex E (informative) - IEEE download web-site material
        associated with this document
Annex F (informative) - Users information and examples
Annex G (informative) - Glossary
Annex H (informative) - Bibliography

The scope of this trial-use standard is the definition of an exchange format, utilizing eXtensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a UUT.

Committee
SCC20 - Test and Diagnosis for Electronic Sys
DocumentType
Standard
ISBN
978-0-7381-6066-5
Pages
195
PublisherName
Institute of Electrical & Electronics Engineers
Status
Superseded
SupersededBy

DEFSTAN 66-031(PT8)/2(2016) : 2016 REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE
DEFSTAN 00-52/4(2014) : 2014 THE GENERAL REQUIREMENTS FOR PRODUCT ACCEPTANCE AND MAINTENANCE TEST SPECIFICATIONS AND TEST SCHEDULES
IEEE 1636.1-2013 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)
IEC 61636-99:2016 Software Interface for Maintenance Information Collection and Analysis (SIMICA): Common Information Elements
IEEE 1671.3-2007 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
IEEE 1636.99-2013 IEEE Std 1636.99-2013, IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Common Information Elements.
BS IEC 61671:2012 IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML
BS IEC 61636:2016 Software Interface for Maintenance Information Collection and Analysis (SIMICA)
BS IEC 61636-1:2016 Software interface for maintenance information collection and analysis (SIMICA): Exchanging test results and session information via the extensible markup language (XML)
IEC 61671:2012 Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
IEC 61636-1:2016 Software interface for maintenance information collection and analysis (SIMICA): Exchanging test results and session information via the extensible markup language (XML)
BS IEC 61636-99:2016 Software Interface for Maintenance Information Collection and Analysis (SIMICA): Common Information Elements
IEC 61636:2016 Software interface for Maintenance Information Collection and Analysis (SIMICA)
IEEE 1641.1-2013 IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition

IEEE 1671.3-2007 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
IEEE 1671.5-2015 REDLINE IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description
IEEE 260.1 : 2004 LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS)
IEEE 488.1 : 2003 STANDARD FOR HIGHER PERFORMANCE PROTOCOL FOR THE STANDARD DIGITAL INTERFACE FOR PROGRAMMABLE INSTRUMENTATION
IEEE 1445-1998 IEEE Standard for Digital Test Interchange Format (DTIF)
MIL-HDBK-1553 Revision A:1988 Multiplex Application Handbook
IEEE 488.2 : 1992 STANDARD CODES, FORMATS, PROTOCOLS, AND COMMON COMMANDS FOR USE WITH IEEE 488.1-1987, IEEE STANDARD DIGITAL INTERFACE FOR PROGRAMMABLE INSTRUMENTATION
MIL-STD-1345 Revision B:1981 TEST REQUIREMENT DOCUMENT PREPARATION OF
IEEE 1641-2004 IEEE Standard for Signal and Test Definition
IEEE 1636.1-2013 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)
IEEE 1671-2006 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
MIL-STD-1519 Base Document:1971 TEST REQUIREMENTS DOCUMENT, PREPARATION OF
IEEE 754-2008 REDLINE IEEE Standard for Floating-Point Arithmetic
MIL-STD-1553 Revision B:1978 DIGITAL TIME DIVISION COMMAND/RESPONSE MULTIPLEX DATA

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