ISO 24173:2009

Superseded

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Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction

Available format(s)

PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

09-02-2024

Language(s)

English, French

Published date

14-09-2009

Publisher

International Organization for Standardization

ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

Committee	ISO/TC 202
DevelopmentNote	Supersedes ISO/DIS 24173. (09/2009)
DocumentType	Standard
Pages	43
PublisherName	International Organization for Standardization
Status	Superseded
SupersededBy	ISO 24173:2024

Standards	Relationship
DIN ISO 24173 E : 2013	Identical
NF ISO 24173 : 2009	Identical
DIN ISO 24173:2013-04	Identical
BS ISO 24173:2009	Identical
NEN ISO 24173 : 2009	Identical
SAC GB/T 30703 : 2014	Identical

PD CEN ISO/TS 80004-6:2015	Nanotechnologies. Vocabulary Nano-object characterization
CEN ISO/TS 80004-6:2015	NANOTECHNOLOGIES - VOCABULARY - PART 6: NANO-OBJECT CHARACTERIZATION (ISO/TS 80004-6:2013)
BS PD ISO/TS 80004-6 : 2013	NANOTECHNOLOGIES - VOCABULARY - PART 6: NANO-OBJECT CHARACTERIZATION
ISO 19214:2017	Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
PD ISO/TR 18196:2016	Nanotechnologies. Measurement technique matrix for the characterization of nano-objects
DIN ISO 13067 E : 2015	MICROBEAM ANALYSIS - ELECTRON BACKSCATTER DIFFRACTION - MEASUREMENT OF AVERAGE GRAIN SIZE (ISO 13067:2011)
NF ISO 13067 : 2012	MICROBEAM ANALYSIS - ELECTRON BACKSCATTER DIFFRACTION - MEASUREMENT OF AVERAGE GRAIN SIZE
S.R. CEN ISO/TS 80004-6:2015	NANOTECHNOLOGIES - VOCABULARY - PART 6: NANO-OBJECT CHARACTERIZATION (ISO/TS 80004-6:2013)
BS ISO 13067:2011	Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
DIN ISO 13067:2015-12	Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
ISO/TR 10993-22:2017	Biological evaluation of medical devices — Part 22: Guidance on nanomaterials
ISO 13067:2011	Microbeam analysis Electron backscatter diffraction Measurement of average grain size
ASTM F 3160 : 2016	Standard Guide for Metallurgical Characterization of Absorbable Metallic Materials for Medical Implants
ISO/TR 18196:2016	Nanotechnologies — Measurement technique matrix for the characterization of nano-objects
ISO/TS 80004-6:2013	Nanotechnologies Vocabulary Part 6: Nano-object characterization
PD ISO/TR 10993-22:2017	Biological evaluation of medical devices Guidance on nanomaterials

ISO/IEC 17025:2005	General requirements for the competence of testing and calibration laboratories
SAC GB/T 19501 : 2013	MICROBEAM ANALYSIS - GENERAL GUIDE FOR ELECTRON BACKSCATTER DIFFRACTION ANALYSIS
ISO/IEC Guide 98-3:2008	Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

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ISO 24173:2009

Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction

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