Connectors for electronic equipment - Tests and measurements Part 2-1: Electrical continuity and contact resistance tests - Test 2a : Contact resistance - Millivolt level method

Available format(s)

Hardcopy , PDF

Language(s)

English, Japanese

Published date

20-03-2005

Publisher

Japanese Standards Association

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This section of JIS C 5402-2 is to define a standard test method to measure the electrical resistance across a pair of mated contacts or a contact with a measuring gauge.

DocumentType	Test Method
Pages	7
PublisherName	Japanese Standards Association
Status	Current

Standards	Relationship
IEC 60512-2-1:2002	Identical

Reaffirmed 2014 2005(R2014) [20/10/2014]2005(R2009) [01/10/2009]2005 [20/03/2005]

JIS C 5402-2-3:2005	Connectors for electronic equipment -- Tests and measurements -- Part 2-3: Electrical continuity and contact resistance tests -- Test 2c: Contact resistance variation
JIS C 5402-11-3:2005	Connectors for electronic equipment - Tests and measurements Part 11-3: Climatic tests - Test 11c: Damp heat, steady state
JIS C 5402-6-2:2005	Connectors for electronic equipment -- Tests and measurements Part 6-2: Dynamic stress tests - Test 6b: Bump
JIS C 5402-11-7:2006	Connectors for electronic equipment -- Tests and measurements -- Part 11-7: Climatic tests -- Test 11g: Flowing mixed gas corrosion test
JIS C 5402-11-10:2005	Connectors for electronic equipment - Tests and measurements Part 11-10: Climatic tests - Test 11j: Cold
JIS C 5402-10-4:2006	Connectors For Electronic Equipment - Tests And Measurements - Part 10-4: Impact Tests (free Components), Static Load Tests (fixed Components), Endurance Tests And Overload Tests - Test 10d: Electrical Overload (connectors)
JIS C 5402-6-1:2005	Connectors for electronic equipment - Tests and measurements Part 6-1: Dynamic stress tests - Test 6a: Acceleration, steady state
JIS C 5402-6-3:2005	Connectors for electronic equipment -- Tests and measurements -- Part 6-3: Dynamic stress tests -- Test 6c: Shock Part 6-3: Dynamic stress tests - Test 6c: Shock
JIS C 5402-11-12:2005	Connectors for electronic equipment - Tests and measurements Part 11-12: Climatic tests - Test 11m: Damp heat, cyclic
JIS C 5402-11-14:2006	Connectors for electronic equipment - Tests and measurements Part 11-14: Climatic tests - Test 11p: Flowing single gas corrosion test
JIS C 5402-6-4:2005	Connectors for electronic equipment -- Tests and measurements -- Part 6-4: Dynamic stress tests -- Test 6d: Vibration (sinusoidal)
JIS C 5402-11-9:2005	Connectors for electronic equipment -- Tests and measurements -- Part 11-9: Climatic tests -- Test 11i: Dry heat Part 11-9: Climatic tests - Test 11i: Dry heat

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JIS C 5402-2-1:2005

Connectors for electronic equipment - Tests and measurements Part 2-1: Electrical continuity and contact resistance tests - Test 2a : Contact resistance - Millivolt level method

Table of Contents

Abstract

General Product Information

International Equivalents

History

Standards Referencing This Book

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