Connectors for electronic equipment -- Tests and measurements -- Part 6-3: Dynamic stress tests -- Test 6c: Shock Part 6-3: Dynamic stress tests - Test 6c: Shock

Available format(s)

Hardcopy , PDF

Language(s)

Japanese, English

Published date

20-03-2005

Publisher

Japanese Standards Association

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This section of JIS C 5402-6 is to define a standard test method to assess the ability of components to withstand specified severities of shock. This test may also be used for similar devices when specified in a detail specification.

DocumentType	Test Method
Pages	0
PublisherName	Japanese Standards Association
Status	Current

Standards	Relationship
IEC 60512-6-3:2002	Identical

Reaffirmed 2014 2005(R2014) [20/10/2014]2005(R2009) [01/10/2009]2005 [20/03/2005]

JIS C 5402-1-1:2005	Connectors for electronic equipment --Tests and measurements-- Part 1-1: General examination -- Test 1a: Visual examination
JIS C 5402-2-1:2005	Connectors for electronic equipment - Tests and measurements Part 2-1: Electrical continuity and contact resistance tests - Test 2a : Contact resistance - Millivolt level method

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JIS C 5402-6-3:2005

Current

Table of Contents

Abstract

General Product Information

International Equivalents

History

Standards Referenced By This Book

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Subcategory

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