JIS C 60068-2-13:1989

Superseded

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This Japanese Industrial Standard specifies the low pressure tests performed at room temperature. Part 2: Tests, Test M: Low air pressure

Available format(s)

Hardcopy , PDF

Superseded date

15-09-2023

Language(s)

Japanese, English

Published date

31-07-1989

Publisher

Japanese Standards Association

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This Japanese Industrial Standard specifies the low pressure tests performed at room temperature.

DocumentType	Standard
Pages	0
PublisherName	Japanese Standards Association
Status	Superseded
SupersededBy	JIS C 60068-2-13:2023
Supersedes	JIS C 5029:1975

Standards	Relationship
IEC 60068-2-13:1983	Identical

Reaffirmed 2015 89(R2015) [20/10/2015]89(R2010) [01/10/2010]89(R1999) [20/06/1999]89 [01/03/1989]

JIS C 60068-1:1993

Environmental testing Part 1: General and guidance

JIS C 2570:1998	Directly heated negative temperature coefficient thermistors
JIS C 5260-1:1999	Potentiometers for use in electronic equipment Part 1: Generic specification
JIS C 6703:2002	Generic specification of crystal filters
JIS C 6703:2008	Crystal filters
JIS C 60068-2-41:1995	Environmental testing Part 2: Tests, Test Z/BM: Combined dry heat/low air pressure tests Part 2: Tests, Test Z/BM: Combined dry heat/low air pressure tests
JIS C 5402:1992	Method for test of connectors for use in electronic equipment
JIS C 6462:1996	Test methods of variable capacitors for use in electronic equipment
JIS C 6701:2007	Generic specification of quartz crystal units
JIS C 6710:2007	Generic specification of crystal controlled oscillators
JIS C 60068-2-61:1996	Environmental testing Part 2: Test methods Test Z/ABDM: Climatic sequence
JIS C 5402-11-11:2005	Connectors for electronic equipment - Tests and measurements Part 11-11: Climatic tests - Test 11k: Low air pressure
JIS C 60068-2-40:1995	Environmental testing Part 2: Tests, Test Z/AM: Combined cold/low air pressure tests
JIS C 5202:1990	Test methods of fixed resistors for electronic equipment
JIS C 5260-2:2000	Potentiometers For Use In Electronic Equipment - Part 2 - Sectional Specification: Lead-screw Actuated And Rotary Preset Potentiometers
JIS C 5201-1:1998	Fixed resistors for use in electronic equipment Part 1: Generic specification
JIS C 5260-4:2000	Potentiometers For Use In Electronic Equipment - Part 4: Sectional Specification: Single-turn Rotary Power Potentiometers
JIS C 2570-1:2006	Directly Heated Negative Temperature Coefficient Thermistors - Part 1: Generic Specification
JIS C 5260-3:2000	Potentiometers For Use In Electronic Equipment - Part 3 - Sectional Specification: Rotary Precision Potentiometers
JIS C 60068-2-39:2004	Environmental Testing - Part 2: Tests - Test Z/amd: Combined Sequential Cold, Low Air Pressure, And Damp Heat Test

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JIS C 60068-2-13:1989

This Japanese Industrial Standard specifies the low pressure tests performed at room temperature. Part 2: Tests, Test M: Low air pressure

Table of Contents

Abstract

General Product Information

International Equivalents

History

Standards Referenced By This Book

Standards Referencing This Book

Category

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