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MIL-STD-750-5 Base Document:2012

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

HIGH RELIABILITY SPACE APPLICATION TEST METHODS FOR SEMICONDUCTOR DEVICES - PART 5: TEST METHODS 5000 THROUGH 5999
Available format(s)

PDF

Superseded date

17-05-2021

Language(s)

English

Publisher

US Military Specs/Standards/Handbooks

FOREWORD
1. SCOPE
2. APPLICABLE DOCUMENTS
3. DEFINITIONS
4. GENERAL REQUIREMENTS
5. DETAILED REQUIREMENTS
6. NOTES

Ascertains uniform test methods for the basic high reliability space application testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations.

Committee
FSC 5961
DocumentType
Standard
Pages
19
PublisherName
US Military Specs/Standards/Handbooks
Status
Superseded
SupersededBy

MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES

ISO 14644-2:2015 Cleanrooms and associated controlled environments Part 2: Monitoring to provide evidence of cleanroom performance related to air cleanliness by particle concentration
MIL-PRF-19500 Revision P:2010 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
SAE ARP 743 : 2001 PROCEDURE FOR THE DETERMINATION OF PARTICULATE CONTAMINATION OF AIR IN DUST CONTROLLED SPACES BY THE PARTICLE COUNT METHOD
ISO 14644-1:2015 Cleanrooms and associated controlled environments Part 1: Classification of air cleanliness by particle concentration
ASTM F 25 : 2004 Standard Test Method for Sizing and Counting Airborne Particulate Contamination in Cleanrooms and Other Dust-Controlled Areas

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