Name: NEN EN 12698-2 : 2007
Brand: NEN

CHEMICAL ANALYSIS OF NITRIDE BONDED SILICON CARBIDE REFRACTORIES - PART 2: XRD METHODS

Published date

12-01-2013

Publisher

Netherlands Standards

Foreword
1 Scope
2 Normative references
3 Definitions
4 Apparatus
5 Sampling
6 Procedure
  6.1 Sample preparation
  6.2 Measuring parameters
  6.3 Qualitative analysis
  6.4 Quantitative analysis
7 Precision
  7.1 Repeatability
  7.2 Reproducibility
8 Test report
Annex A (normative) X-ray diffraction data for the
        determination of beta -SiAION content
  A.1 General
  A.2 Example of calculation of z-value for beta -SiAION
Bibliography

Specifies methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano diffractometer.

DevelopmentNote	Supersedes NEN EN 12698. (05/2007)
DocumentType	Standard
PublisherName	Netherlands Standards
Status	Current
Supersedes	NEN EN 12698 : DRAFT 2005

Standards	Relationship
DIN EN 12698-2 E : 2007	Identical
UNE-EN 12698-2:2007	Identical
UNI EN 12698-2 : 2007	Identical
EN 12698-2:2007	Identical
BS EN 12698-2:2007	Identical
DIN EN 12698-2:2007-06	Identical

View more information

Sorry this product is not available in your region.

Access your standards online with a subscription

Features

Simple online access to standards, technical information and regulations.
Critical updates of standards and customisable alerts and notifications.
Multi-user online standards collection: secure, flexible and cost effective.

Learn more on subscription solutions

Get in touch with us

Log into your Account

NEN EN 12698-2 : 2007

Current

Table of Contents

Abstract

General Product Information

International Equivalents

Category

Subcategory

Access your standards online with a subscription