NEN-ISO 22581:2021
Current
Current
The latest, up-to-date edition.
Surface chemical analysis - Near real-time information from the X-ray photoelectron spectroscopy survey scan - Rules for identification of, and correction for, surface contamination by carbon-containing compounds
Available format(s)
Hardcopy
Language(s)
English
Published date
01-04-2021
Publisher
NEN-ISO 22581 is provided to assist in the surface analysis of thin films on materials which are not thought to contain carbon compounds as intended components but for which a C1s peak is observed in the survey spectrum.
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