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NFC 86 020 : 85 AMD 1 87

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - MONOLITHIC INTEGRATED CIRCUITS - GENERIC SPECIFICATION
Superseded date

01-04-2013

Published date

12-01-2013

PREAMBULE
PREFACE
1 DOMAINE D'APPLICATION
2 GENERALITES
  2.1 Ordre de priorité
  2.2 Documents applicables
  2.3 Unités, symboles et terminologie
  2.4 Valeurs normalisées et préférentielles
  2.5 Marquage du composant et de son emballage
  2.6 Identification a la commande
3 PROCEDURES D'ASSURANCE DE LA QUALITE
  3.1 Etape initiale de fabrication et sous-traitance
  3.2 Modèles associables
  3.3 Procédures d'homologation
  3.4 Controle de conformité de la qualité
4 PROCEDURES D'ESSAIS ET DE MESURES
  4.1 Conditions normales d'essai
  4.2 Examen visuel
  4.3 Dimensions
  4.4 Immersion dans les solvants de nettoyage
  4.5 Mesures électriques
  4.6 Essais climatiques et mécaniques
  4.7 Définition des axes pour les essais mécaniques
  4.8 Essais d'endurance électrique
  4.9 Procédures d'essais accélères
  4.10 Sélection
ANNEXE A: Examen visuel interne (éditée séparément)
ANNEXE B: Comparaison entre les documents CEI et CECC concernant
les essais climatiques et mécaniques et d'endurance électrique

Presents terms, definitions, symbols, test methods and other material for monolithic integrated (micro) circuits, as defined in IEC 747, required to prepare appropriate detail specifications in the CECC System. Supplementary requirements for different families of integrated microcircuits are given in separate specifications.

DevelopmentNote
Indice de Classement: C86-020 (02/2002)
DocumentType
Standard
PublisherName
Association Francaise de Normalisation
Status
Superseded
SupersededBy

Standards Relationship
CECC 90000 : 90 AMD 1 Identical

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