PD IEC/TS 62668-2:2016

Superseded

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Process management for avionics. Counterfeit prevention Managing electronic components from non-franchised sources

Available format(s)

Hardcopy , PDF

Superseded date

07-10-2019

Language(s)

English

Published date

31-08-2016

Publisher

British Standards Institution

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
4 Technical requirements
Annex A (informative) - Flowchart of IEC TS 62668-1
        requirements
Annex B (informative) - Example of detailed tests
        list, linked with procurement risks levels
Annex C (informative) - iNEMI assessment methodology
        and metric development
Annex D (informative) - Summary of SAE AS6171
        proposed test methods under consideration by
        SAE International
Bibliography

Describes requirements for avoiding the use of counterfeit, recycled and fraudulent components when these components are not purchased from the original component manufacturer (OCM) or are purchased from outside of franchised distributor networks for use in the aerospace, defence and high performance (ADHP) industries.

This part of IEC 62668, which is a technical specification, defines requirements for avoiding the use of counterfeit, recycled and fraudulent components when these components are not purchased from the original component manufacturer (OCM) or are purchased from outside of franchised distributor networks for use in the aerospace, defence and high performance (ADHP) industries. This practice is used, as derogation, only when there are no reasonable or practical alternatives.

NOTE Typically this technical specification is used in conjunction with IEC TS 62239-1 and IEC TS 62668-1,

enabling ADHP industries to manage and avoid the use of counterfeit, recycled and fraudulent components in their supply chains.

Although developed for the ADHP industry, this document may be used by other high-performance and high-reliability industries, at their discretion.

Committee	GEL/107
DocumentType	Standard
Pages	50
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	BS EN IEC 62668-2:2019
Supersedes	PD IEC/TS 62668-2:2014

Standards	Relationship
IEC TS 62668-2:2016	Identical

EN 9100:2009	Quality Management Systems - Requirements for Aviation, Space and Defense Organizations
SAE AS 5553B : 2016	COUNTERFEIT ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL (EEE) PARTS; AVOIDANCE, DETECTION, MITIGATION, AND DISPOSITION
ISO 16678:2014	Guidelines for interoperable object identification and related authentication systems to deter counterfeiting and illicit trade
SAE AS 6174 : 2014	COUNTERFEIT MATERIEL - ASSURING ACQUISITION OF AUTHENTIC AND CONFORMING MATERIEL
SAE AS 6171/1 : 2016	SUSPECT/COUNTERFEIT TEST EVALUATION METHOD
SAE AS 6171 : 2016	TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS
MIL-STD-883 Revision K:2016	TEST METHOD STANDARD - MICROCIRCUITS
SAE AS 6171/6 : 2016	TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY ACOUSTIC MICROSCOPY (AM) TEST METHODS
IEC PAS 62435:2005	Electronic components - Long-duration storage of electronic components - Guidance for implementation
MIL-PRF-55681 Revision G:2016	CAPACITOR, CHIP, MULTIPLE LAYER, FIXED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
SAE AS 6171/11 : 2016	TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DESIGN RECOVERY TEST METHODS
SAE AS 6171/7 : 2016	TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY ELECTRICAL TEST METHODS
MIL-PRF-19500 Revision P:2010	SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
ISO 31000:2009	Risk management Principles and guidelines
IEC TS 62668-1:2016	Process management for avionics - Counterfeit prevention - Part 1: Avoiding the use of counterfeit, fraudulent and recycled electronic components
SEMI T20.2 : 2009(R2016)	GUIDE FOR QUALIFICATIONS OF AUTHENTICATION SERVICE BODIES FOR DETECTING AND PREVENTING COUNTERFEITING OF SEMICONDUCTORS AND RELATED PRODUCTS
MIL-STD-750 Revision F:2011	TEST METHODS FOR SEMICONDUCTOR DEVICES
MIL-STD-202-107 Base Document:2015	METHOD 107, THERMAL SHOCK
MIL-STD-202-106 Base Document:2015	METHOD 106, MOISTURE RESISTANCE
MIL-PRF-39014 Revision J:2016	Capacitor, Fixed, Ceramic Dielectric (General Purpose), Established Reliability and Non-Established Reliability, General Specification for
IEC TS 62239-1:2015	Process management for avionics - Management plan - Part 1: Preparation and maintenance of an electronic components management plan
IPC J STD 033C-1:2014	HANDLING, PACKING, SHIPPING AND USE OF MOISTURE, REFLOW, AND PROCESS SENSITIVE DEVICES
SAE AS 6171/8 : 2016	TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RAMAN SPECTROSCOPY TEST METHODS
SAE AS 6171/3 : 2016	TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY X-RAY FLUORESCENCE TEST METHODS
IPC J STD 002 : D	SOLDERABILITY TESTS FOR COMPONENT LEADS, TERMINATIONS, LUGS, TERMINALS AND WIRES
SAE AS 6171/4 : 2016	TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DELID/DECAPSULATION PHYSICAL ANALYSIS TEST METHODS
SEMI T20.1 : 2009(R2016)	SPECIFICATION FOR OBJECT LABELING TO AUTHENTICATE SEMICONDUCTORS AND RELATED PRODUCTS IN AN OPEN MARKET
GEIA STD 0016 : 2012	PREPARING A DMSMS MANAGEMENT PLAN
ISO 14001:2015	Environmental management systems — Requirements with guidance for use
IEC TS 62686-1:2015	Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
SAE ARP 6178 : 2011	FRAUDULENT/COUNTERFEIT ELECTRONIC PARTS - TOOL FOR RISK ASSESSMENT OF DISTRIBUTORS
SAE AS 6171/9 : 2016	TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY FOURIER TRANSFORM INFRARED SPECTROSCOPY (FTIR) TEST METHODS
MIL-PRF-39003 Revision N:2016	Capacitor, Fixed, Electrolytic (Solid Electrolyte), Tantalum, Established Reliability, General Specification for
ISO 9001:2015	Quality management systems — Requirements
MIL-STD-202-108 Base Document:2015	METHOD 108, LIFE (AT ELEVATED AMBIENT TEMPERATURE)
SAE AS 6171/5 : 2016	TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RADIOLOGICAL TEST METHODS
MIL-STD-1580 Revision B:2003	DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS
IEC 60068-2-1:2007	Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60115-8:2009	Fixed resistors for use in electronic equipment - Part 8: Sectional specification - Fixed surface mount resistors
SEMI T20 : 2010(R2016)	SPECIFICATION FOR AUTHENTICATION OF SEMICONDUCTORS AND RELATED PRODUCTS
EN 9120:2010	Quality Management Systems - Requirements for Aviation, Space and Defence Distributors
SAE AS 6171/10 : 2016	TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY THERMOGRAVIMETRIC ANALYSIS (TGA) TEST METHODS
ISO Guide 73:2009	Risk management — Vocabulary
IEC 60068-2-30:2005	Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)

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PD IEC/TS 62668-2:2016

Superseded

Table of Contents

Abstract

Scope

General Product Information

International Equivalents

Standards Referencing This Book

Category

Subcategory

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