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SAE J 1752/2 : 2016

Current
Current

The latest, up-to-date edition.

MEASUREMENT OF RADIATED EMISSIONS FROM INTEGRATED CIRCUITS - SURFACE SCAN METHOD (LOOP PROBE METHOD) 10 MHZ TO 3 GHZ
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

16-09-2016

1. SCOPE
2. REFERENCES
3. DEFINITIONS
4. TEST CONDITIONS
5. TEST EQUIPMENT
6. TEST SET-UP
7. TEST PROCEDURE
8. DATA PRESENTATION
9. NOTES
APPENDIX A - ANALYZING THE DATA FROM NEAR FIELD
             SURFACE SCANNING

Describes a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC).

DocumentType
Standard
Pages
10
ProductNote
THIS VERSION IS NOW STABILIZED
PublisherName
SAE International
Status
Current
Supersedes

SAE J 2578 : 2014 RECOMMENDED PRACTICE FOR GENERAL FUEL CELL VEHICLE SAFETY
SAE J 1752/1 : 2016 ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS - INTEGRATED CIRCUIT EMC MEASUREMENT PROCEDURES - GENERAL AND DEFINITIONS

SAE J 1752/1 : 2016 ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS - INTEGRATED CIRCUIT EMC MEASUREMENT PROCEDURES - GENERAL AND DEFINITIONS

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