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  • UNE-EN 61882:2017

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    Hazard and operability studies (HAZOP studies) - Application guide

    Available format(s):  Hardcopy, PDF

    Language(s):  Spanish, Castilian, English

    Published date:  12-04-2017

    Publisher:  Asociacion Espanola de Normalizacion

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    Committee CTN 200/SC 56
    Document Type Standard
    Publisher Asociacion Espanola de Normalizacion
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    UNE 200008:2018 IN Qualification of technical and management personnel in the field of Dependability and Industrial Safety engineering (RAMS Engineer)

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61025:2006 Fault tree analysis (FTA)
    EN 60812 : 2006 ANALYSIS TECHNIQUES FOR SYSTEM RELIABILITY - PROCEDURE FOR FAILURE MODE AND EFFECTS ANALYSIS (FMEA)
    IEC 60812:2006 Analysis techniques for system reliability - Procedure for failure mode and effects analysis (FMEA)
    IEC/ISO 31010:2009 Risk management - Risk assessment techniques
    ISO 31000:2009 Risk management Principles and guidelines
    IEC 61160:2005 Design review
    EN 62502 : 2010 ANALYSIS TECHNIQUES FOR DEPENDABILITY - EVENT TREE ANALYSIS (ETA)
    IEC 62502:2010 Analysis techniques for dependability - Event tree analysis (ETA)
    EN 61511-3:2017 FUNCTIONAL SAFETY - SAFETY INSTRUMENTED SYSTEMS FOR THE PROCESS INDUSTRY SECTOR - PART 3: GUIDANCE FOR THE DETERMINATION OF THE REQUIRED SAFETY INTEGRITY LEVELS (IEC 61511-3:2016)
    IEC 61511-3:2016 Functional safety - Safety instrumented systems for the process industry sector - Part 3: Guidance for the determination of the required safety integrity levels
    EN 61025 : 2007 FAULT TREE ANALYSIS (FTA)
    EN 61160 : 2005 DESIGN REVIEW
    DEFSTAN 00-58(PT1)/2(2000) : 2000 HAZOP STUDIES ON SYSTEMS CONTAINING PROGRAMMABLE ELECTRONICS - PART 1: REQUIREMENTS
    EN 31010 : 2010 RISK MANAGEMENT - RISK ASSESSMENT TECHNIQUES (IEC/ISO 31010:2009)
    ISO Guide 73:2009 Risk management Vocabulary
    DEFSTAN 00-58(PT2)/2(2000) : 2000 HAZOP STUDIES ON SYSTEMS CONTAINING PROGRAMMABLE ELECTRONICS - PART 2: GENERAL APPLICATION GUIDANCE
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