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    • Transistors
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    BS IEC 62899-503-3:2021

    Printed electronics - Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method

    British Standards Institution

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    BS IEC 60747-9:2019

    Semiconductor devices. Discrete devices. Insulated-gate bipolar transistors (IGBTs)

    British Standards Institution

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    BS IEC 60747-7:2010+A1:2019

    Semiconductor devices. Discrete devices. Bipolar transistors

    British Standards Institution

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    BS EN 62416 : 2010

    SEMICONDUCTOR DEVICES - HOT CARRIER TEST ON MOS TRANSISTORS

    British Standards Institution

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    BS EN 62417 : 2010

    SEMICONDUCTOR DEVICES - MOBILE ION TESTS FOR METAL-OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTORS (MOSFETS)

    British Standards Institution

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    BS IEC 60747-4:2007+A1:2017

    Semiconductor devices. Discrete devices. Microwave diodes and transistors

    British Standards Institution

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    NEN-IEC 62373-1:2020

    Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET

    Netherlands Standards

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    DS EN 120003 : 1992

    BLANK DETAIL SPECIFICATION: PHOTOTRANSISTORS, PHOTODARLINGTON TRANSISTORS, PHOTOTRANSISTOR ARRAYS

    Danish Standards

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    DS EN 120004 : 1992

    BLANK DETAIL SPECIFICATION: AMBIENT RATED PHOTOCOUPLERS WITH PHOTOTRANSISTOR OUTPUT

    Danish Standards

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    NEN-IEC 60747-9:2019

    Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)

    Netherlands Standards

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