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    • Semiconductor devices in general
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    BS IEC 62779-4 : 2020

    Semiconductor devices. Semiconductor interface for human body communication. Capsule endoscope

    British Standards Institution

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    BS IEC 60191-2:1966+A21:2020

    Mechanical standardization of semiconductor devices. Dimensions

    British Standards Institution

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    BS IEC 60747-18-3:2019

    Semiconductor devices. Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system

    British Standards Institution

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    BS IEC 60747-19-1:2019

    Semiconductor devices. Smart sensors. Control scheme of smart sensors

    British Standards Institution

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    BS IEC 60747-9:2019

    Semiconductor devices. Discrete devices. Insulated-gate bipolar transistors (IGBTs)

    British Standards Institution

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    BS IEC 60747-14-10:2019

    Semiconductor devices. Semiconductor sensors. Performance evaluation methods for wearable glucose sensors

    British Standards Institution

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    BS EN IEC 60747-16-6:2019

    Semiconductor devices. Microwave integrated circuits. Frequency multipliers

    British Standards Institution

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    BS EN IEC 60749-17:2019

    Semiconductor devices. Mechanical and climatic test methods. Neutron irradiation

    British Standards Institution

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    BS IEC 62951-5 : 2019

    Semiconductor devices. Flexible and stretchable semiconductor devices. Test method for thermal characteristics of flexible materials

    British Standards Institution

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    18/30366379 DC:2018

    BS IEC 63068-2. Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Part 2. Test method for defects using optical inspection

    British Standards Institution

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