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    • JEDEC
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    JEDEC JESD22-B118A:2021

    SEMICONDUCTOR WAFER AND DIE BACKSIDE EXTERNAL VISUAL INSPECTION

    JEDEC Solid State Technology Association

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    JEDEC JESD82-10A.01:2021

    DEFINITION OF THE SSTU32866 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS

    JEDEC Solid State Technology Association

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    JEDEC JESD82-16A.01:2021

    DEFINITION OF THE SSTUA32866 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY TEST FOR DDR2 RDIMM APPLICATIONS

    JEDEC Solid State Technology Association

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    JEDEC JESD230E:2021

    NAND FLASH INTERFACE INTEROPERABILITY

    JEDEC Solid State Technology Association

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    JEDEC JEP106BD:2021

    STANDARD MANUFACTURERS IDENTIFICATION CODE

    JEDEC Solid State Technology Association

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    JEDEC JESD82-9B.01:2021

    DEFINITION OF SSTU32865 REGISTERED BUFFER WITH PARITY FOR 2R x 4 DDR2 RDIMM APPLICATIONS

    JEDEC Solid State Technology Association

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    JEDEC JESD82-19A.01:2021

    DEFINITION OF THE SSTUA32S865 AND SSTUA32D865 28-BIT 1:2 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS

    JEDEC Solid State Technology Association

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    JEDEC JESD82-14A.01:2021

    Definition of the SSTUB32868 1.8 V (Minor Editorial Revision of JESD82-14A, October 2006) Configurable Registered Buffer with Parity for DDR2 RDIMM Applications

    JEDEC Solid State Technology Association

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    JEDEC JESD89-3B:2021

    Test Method for Beam Accelerated Soft Error Rate

    JEDEC Solid State Technology Association

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    JEDEC JESD89B:2021

    MEASUREMENT AND REPORTING OF ALPHA PARTICLE AND TERRESTRIAL COSMIC RAY INDUCED SOFT ERRORS IN SEMICONDUCTOR DEVICES

    JEDEC Solid State Technology Association

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