Name: 02/203838 DC : DRAFT MAR 2002
Brand: BSI

Superseded date

14-08-2003

Published date

23-11-2012

Publisher

British Standards Institution

Committee	GEL/107
DocumentType	Draft
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	DD IEC/TS 62239:2003

ISO/TR 9122-1:1989	Toxicity testing of fire effluents Part 1: General
MIL-STD-883 Revision K:2016	TEST METHOD STANDARD - MICROCIRCUITS
IECQ 001003:1998	IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - GUIDANCE DOCUMENTS
IEC PAS 62240:2001	Use of semiconductor devices outside manufacturers' specified temperature range
IEC 61340-5-1:2016	Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements
DEFSTAN 00-71/1(1998) : 1998	OBSOLESCENCE MANAGEMENT
IEC QC 001004 : 2.0
ISO 9004:2009	Managing for the sustained success of an organization A quality management approach
ISO 9001:2015	Quality management systems — Requirements
IEC 61967-6:2002+AMD1:2008 CSV	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
ISO 9000:2015	Quality management systems — Fundamentals and vocabulary
MIL-HDBK-512 Revision A:2001	PARTS MANAGEMENT
MIL-PRF-38535 Revision K:2013	Integrated Circuits (Microcircuits) Manufacturing, General Specification for
AIAA R 100 : A 2001	RECOMMENDED PRACTICE FOR PARTS MANAGEMENT
EN 190000:1995	Generic Specification: Monolithic integrated circuits

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