Name: 07/30148822 DC : 0
Brand: BSI

BS IEC 62047-4 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 4: GENERIC SPECIFICATIONS FOR MEMS

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Hardcopy , PDF

Superseded date

30-11-2010

Language(s)

English

Publisher

British Standards Institution

Committee	EPL/47
DocumentType	Draft
Pages	23
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	BS EN 62047-4:2010

IEC 60410:1973	Sampling plans and procedures for inspection by attributes
IEC 60721-2-1:2013	Classification of environmental conditions - Part 2-1: Environmental conditions appearing in nature - Temperature and humidity
IEC 62047-1:2016	Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions
IEC 60721-3-0:1984+AMD1:1987 CSV	Classification of environmental conditions - Part 3: Classification of groups of environmental parameters and their severities - Introduction
IEC 60747-1:2006+AMD1:2010 CSV	Semiconductor devices - Part 1: General
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV	Semiconductor devices - Mechanical and climatic test methods
IEC 60721-3-1:1997	Classification of environmental conditions - Part 3 Classification of groups of environmental parameters and their severities - Section 1: Storage

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