10/30185165 DC : 0

Superseded

BS ISO 11938 - MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSIS - METHODS OF ELEMENTAL AREA ANALYSIS USING WAVELENGTH-DISPERSIVE SPECTROSCOPY

Available format(s)

Hardcopy , PDF

Superseded date

30-04-2013

Language(s)

English

Publisher

British Standards Institution

Foreword
Introduction
1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
4 Preparation of mapping analysis
5 Methods for the displaying of elemental mapping
6 Evaluation of uncertainty
7 Report
8 Annex A (informative) - Comparison of the absorption
effect for a light element
Bibliography

Committee	CII/9
DocumentType	Draft
Pages	19
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	BS ISO 11938:2012

ISO/IEC 17025:2005	General requirements for the competence of testing and calibration laboratories
ISO 5725-6:1994	Accuracy (trueness and precision) of measurement methods and results — Part 6: Use in practice of accuracy values
ISO 23833:2013	Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
ISO 22489:2016	Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
ISO 16592:2012	Microbeam analysis — Electron probe microanalysis — Guidelines for determining the carbon content of steels using a calibration curve method
ISO 14594:2014	Microbeam analysis Electron probe microanalysis Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 17470:2014	Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry