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12/30241146 DC : 0

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

BS ISO 16531 - SURFACE CHEMICAL ANALYSIS - DEPTH PROFILING - METHODS FOR ION BEAM ALIGNMENT AND THE ASSOCIATED MEASUREMENT OF CURRENT OR CURRENT DENSITY FOR DEPTH PROFILING IN AES AND XPS

Available format(s)

Hardcopy , PDF

Superseded date

31-05-2013

Language(s)

English

Foreword
Introduction
1 Scope
2 Normative references
3 Symbols and abbreviated terms
4 Requirement of the system
5 Procedures of ion beam alignment
6 When to align and check the ion beam
  alignment
Annex A (informative) - Comparison of AES depth
        profiles with good and poor ion beam
        alignment
Annex B (informative) - Alignment method using a
        cup with co-axial electrodes
Bibliography

BS ISO 16531.

Committee
CII/60
DocumentType
Draft
Pages
23
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

ISO 18115-1:2013 Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
ISO 14606:2015 Surface chemical analysis — Sputter depth profiling — Optimization using layered systems as reference materials

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