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Superseded

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BS EN 60679-1 - PIEZOELECTRIC AND ASSOCIATED MATERIAL OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION

Available format(s)

Hardcopy , PDF

Superseded date

31-12-2017

Language(s)

English

Publisher

British Standards Institution

FOREWORD
INTRODUCTION
1 Scope
2 Normative reference
3 Terms, definitions and general information
4 Quality assessment procedures
Annex A (normative) - Load circuit for logic
        drive
Annex B (normative) - Latch-up test
Annex C (normative) - Electrostatic discharge
        sensitivity classification
Annex D (normative) - Digital Interface crystal
        oscillator's function
Bibliography

BS EN 60679-1

Committee	EPL/49
DocumentType	Draft
Pages	31
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	BS EN 60679-1:2007

IEC 61837-1:2012	Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
IEC 60679-4:1997	Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval
IEC 61837-2:2011+AMD1:2014 CSV	Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part2: Ceramic enclosures
IEC 60679-5:1998	Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
IEC 61837-4:2015	Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
IEC 60749-27:2006+AMD1:2012 CSV	Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
IEC 61019-1:2004	Surface acoustic wave (SAW) resonators - Part 1: Generic specification
IEC 60469-1:1987	Pulse techniques and apparatus. Part 1: Pulse terms and definitions
IEC 60410:1973	Sampling plans and procedures for inspection by attributes
IEC GUIDE 102:1996	Electronic components - Specification structures for qualityassessment (Qualification approval and capability approval)
IEC 61019-2:2005	Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
IEC 60749-26:2013	Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
IEC 60050-561:2014	International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
IEC 60122-1:2002	Quartz crystal units of assessed quality - Part 1: Generic specification
IEC 60748-2:1997	Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
IEC 60679-3:2012	Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
IEC 60679-2:1981	Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators