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14/30294910 DC : 0

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

BS EN 62047-26 ED1.0 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 26: DESCRIPTION AND MEASUREMENT METHODS FOR MICRO TRENCH AND NEEDLE STRUCTURES

Available format(s)

Hardcopy , PDF

Superseded date

31-05-2016

Language(s)

English

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Description of trench structures in a
  micrometer scale
5 Description of needle structures in a
  micrometer scale
6 Measurement method
Annex A (informative) - Examples of measurement for
        trench & needle structures in a micrometer scale
Annex B (informative) - Uncertainty in Dimensional
        Measurement
Bibliography

BS EN 62047-26 Ed1.0.

Committee
EPL/47
DocumentType
Draft
Pages
29
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

ISO 3274:1996 Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments
ISO 129-1:2004 Technical drawings Indication of dimensions and tolerances Part 1: General principles
ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

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£20.00
Excluding VAT

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