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Superseded

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BS ISO 16700 - MICROBEAM ANALYSIS - SCANNING ELECTRON MICROSCOPY - GUIDELINES FOR CALIBRATING IMAGE MAGNIFICATION

Available format(s)

Hardcopy , PDF

Superseded date

31-07-2016

Language(s)

English

Publisher

British Standards Institution

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Image magnification
5 Reference material
6 Calibration procedures
7 Accuracy of image magnification and scale marker
8 Calibration report
Annex A (informative) - Reference materials for magnification
Annex B (informative) - Parameters that influence the
resultant magnification of an SEM
Annex C (informative) - Uncertainties in magnification
measurements
Annex D (informative) - Example of a test report
Bibliography

BS ISO 16700.

Committee	CII/9
DocumentType	Draft
Pages	24
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	BS ISO 16700:2004

ISO/IEC 17025:2005	General requirements for the competence of testing and calibration laboratories
ISO 5725-1:1994	Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions
ISO Guide 35:2017	Reference materials Guidance for characterization and assessment of homogeneity and stability
ISO Guide 30:2015	Reference materials Selected terms and definitions
ISO Guide 34:2009	General requirements for the competence of reference material producers
ISO/IEC Guide 98-3:2008	Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)