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17/30356569 DC : 0

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

BS EN 60749-26 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 26: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - HUMAN BODY MODEL (HBM)

Available format(s)

Hardcopy , PDF

Superseded date

30-04-2018

Language(s)

English

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Apparatus and required equipment
5 Stress test equipment qualification
  and routine verification
6 Classification procedure
7 Failure criteria
8 Component classification
Annex A (informative) - HBM test method
        flow chart
Annex B (informative) - HBM test equipment
        parasitic properties
Annex C (informative) - Example of testing
        a product using Table 2, Table 3, or
        Table 2 with a two-pin HBM tester
Annex D (informative) - Examples of coupled
        non-supply pin pairs
Annex E (normative) - Cloned non-supply (IO)
        pin sampling test method

BS EN 60749-26.

Committee
EPL/47
DocumentType
Draft
Pages
51
PublisherName
British Standards Institution
Status
Superseded

IEC 60749-27:2006+AMD1:2012 CSV Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

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£20.00
Excluding VAT

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