ASTM E 1250 : 2010

Name: ASTM E 1250 : 2010
Brand: ASTM
Price: 62.61 GBP

Superseded

View Superseded by

Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices

Available format(s)

Hardcopy , PDF

Superseded date

11-11-2014

Language(s)

English

Published date

01-12-2010

Publisher

American Society for Testing and Materials

Low energy components in the photon energy spectrum of Co-60 irradiators lead to absorbed dose enhancement effects in the radiation-hardness testing of silicon electronic devices.

1.1 Low energy components in the photon energy spectrum of Co-60 irradiators lead to absorbed dose enhancement effects in the radiation-hardness testing of silicon electronic devices. These low energy components may lead to errors in determining the absorbed dose in a specific device under test. This method covers procedures for the use of a specialized ionization chamber to determine a figure of merit for the relative importance of such effects. It also gives the design and instructions for assembling this chamber.

1.2 This method is applicable to measurements in Co-60 radiation fields where the range of exposure rates is 7 × 10⁻⁶ to 3 × 10⁻² C kg⁻¹ s⁻¹ (approximately 100 R/h to 100 R/s). For guidance in applying this method to radiation fields where the exposure rate is >100 R/s, see Appendix X1.

Note 1—See Terminology E170 for definition of exposure and its units.

1.3 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Committee	E 10
DocumentType	Test Method
Pages	10
PublisherName	American Society for Testing and Materials
Status	Superseded
SupersededBy	ASTM E 1250 : 2015
Supersedes	ASTM E 1250 : 1988 : R2005

ASTM E 1249 : 2015	Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
ASTM F 1190 : 2018	Standard Guide for Neutron Irradiation of Unbiased Electronic Components
ASTM E 1854 : 2013	Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts