Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-11-2019

Publisher

American Society for Testing and Materials

1.1This practice lists the minimum information necessary to describe the instrumental, experimental, and data reduction procedures used in acquiring and reporting images generated by secondary ion mass spectrometry (SIMS).

1.2The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.4This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Committee	E 42
DocumentType	Standard Practice
Pages	3
PublisherName	American Society for Testing and Materials
Status	Current
Supersedes	ASTM E 1635 : 2006 : R2011

ASTM F 2883 : 2011	Standard Guide for Characterization of Ceramic and Mineral Based Scaffolds used for Tissue-Engineered Medical Products (TEMPs) and as Device for Surgical Implant Applications (Withdrawn 2020)
ASTM F 2847 : 2017	Standard Practice for Reporting and Assessment of Residues on Single-Use Implants and Single-Use Sterile Instruments

ASTM E 673 : 2002	Standard Terminology Relating to Surface Analysis
ASTM E 673 : 2002 : REV B	Standard Terminology Relating to Surface Analysis
ASTM E 1504 : 2011 : R2019	Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)