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ASTM E 2246 : 2011 : R2018

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer (Withdrawn 2023)

Available format(s)

Hardcopy , PDF

Withdrawn date

28-05-2018

Language(s)

English

Published date

28-05-2018

1.1This test method covers a procedure for measuring the strain gradient in thin, reflecting films. It applies only to films, such as found in microelectromechanical systems (MEMS) materials, which can be imaged using an optical interferometer, also called an interferometric microscope. Measurements from cantilevers that are touching the underlying layer are not accepted.

1.2This test method uses a non-contact optical interferometric microscope with the capability of obtaining topographical 3-D data sets. It is performed in the laboratory.

1.3This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.4This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Committee
E 08
DocumentType
Test Method
Pages
21
PublisherName
American Society for Testing and Materials
Status
Withdrawn
Supersedes

ASTM E 2444 : 2011 : R2018 Standard Terminology Relating to Measurements Taken on Thin, Reflecting Films
ASTM E 2244 : 2011 : R2018 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer (Withdrawn 2023)
ASTM E 2245 : 2011 : R2018 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer (Withdrawn 2023)

ASTM E 2444 : 2005 Terminology Relating to Measurements Taken on Thin, Reflecting Films
ASTM E 2244 : 2002 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
ASTM E 2530 : 2006 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps (Withdrawn 2015)
ASTM E 2245 : 2002 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer

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