Name: ASTM E 2695 : 2009
Brand: ASTM
Price: 69.29 GBP

ASTM E 2695 : 2009

Withdrawn

Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy (Withdrawn 2018)

Available format(s)

Hardcopy , PDF

Withdrawn date

17-01-2018

Language(s)

English

Published date

01-05-2009

Publisher

American Society for Testing and Materials

CONTAINED IN VOL. 03.06, 2015 Defines time-of-flight secondary ion mass spectrometry (ToF-SIMS) users with a method for forms of interpretation of mass spectral data.

1.1 This guide provides time-of-flight secondary ion mass spectrometry (ToF-SIMS) users with a method for forms of interpretation of mass spectral data. This guide is applicable to most ToF-SIMS instruments and may or may not be applicable to other forms of secondary icon mass spectrometry (SIMS).

1.2 This guide does not purport to address methods of sample preparation. It is the responsibility of the user to adhere to strict sample preparation procedures in order to minimize contamination and optimize signals. See Guide E1078 and ISO 18116 for sample preparation guidelines.

1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Committee	E 42
DocumentType	Guide
Pages	12
PublisherName	American Society for Testing and Materials
Status	Withdrawn

ISO 23830:2008	Surface chemical analysis — Secondary-ion mass spectrometry — Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
ASTM E 1078 : 2014 : REDLINE	Standard Guide for Specimen Preparation and Mounting in Surface Analysis
ASTM E 1504 : 2011 : REDLINE	Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM E 673 : 2003	Standard Terminology Relating to Surface Analysis (Withdrawn 2012)
ISO 18115:2001	Surface chemical analysis Vocabulary
ISO 18116:2005	Surface chemical analysis Guidelines for preparation and mounting of specimens for analysis