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ASTM E 2859 : 2011 : R2017

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
Available format(s)

Hardcopy , PDF

Superseded date

18-10-2023

Language(s)

English

Published date

04-08-2017

CONTAINED IN VOL. 14.02, 2017 Gives guidance on the quantitative application of atomic force microscopy (AFM) to determine the size of nanoparticles deposited in dry form on flat substrates using height (z-displacement) measurement.

1.1The purpose of this document is to provide guidance on the quantitative application of atomic force microscopy (AFM) to determine the size of nanoparticles2 deposited in dry form on flat substrates using height (z-displacement) measurement. Unlike electron microscopy, which provides a two-dimensional projection or a two-dimensional image of a sample, AFM provides a three-dimensional surface profile. While the lateral dimensions are influenced by the shape of the probe, displacement measurements can provide the height of nanoparticles with a high degree of accuracy and precision. If the particles are assumed to be spherical, the height measurement corresponds to the diameter of the particle. In this guide, procedures are described for dispersing gold nanoparticles on various surfaces such that they are suitable for imaging and height measurement via intermittent contact mode AFM. Generic procedures for AFM calibration and operation to make such measurements are then discussed. Finally, procedures for data analysis and reporting are addressed. The nanoparticles used to exemplify these procedures are National Institute of Standards and Technology (NIST) reference materials containing citrate-stabilized negatively charged gold nanoparticles in an aqueous solution.

1.2The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

1.4This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Committee
E 56
DocumentType
Guide
Pages
9
ProductNote
Reconfirmed 2017
PublisherName
American Society for Testing and Materials
Status
Superseded
SupersededBy
Supersedes

ASTM E 2587 : 2016 Standard Practice for Use of Control Charts in Statistical Process Control
ASTM E 2587 : 2014 Standard Practice for Use of Control Charts in Statistical Process Control
ASTM E 2530 : 2006 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps (Withdrawn 2015)
ASTM E 2382 : 2004 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E 1617 : 2009 : R2019 Standard Practice for Reporting Particle Size Characterization Data
ASTM E 2587 : 2007 : EDT 1 Standard Practice for Use of Control Charts in Statistical Process Control
ASTM E 2587 : 2015 Standard Practice for Use of Control Charts in Statistical Process Control
ASTM E 2587 : 2010 Standard Practice for Use of Control Charts in Statistical Process Control
ASTM E 1617 : 2009 : R2014 : EDT 1 Standard Practice for Reporting Particle Size Characterization Data
ASTM E 1617 : 1997 : R2007 Standard Practice for Reporting Particle Size Characterization Data
ASTM E 2587 : 2016 : R2021 : EDT 1 Standard Practice for Use of Control Charts in Statistical Process Control
ASTM E 2587 : 2016 : REDLINE Standard Practice for Use of Control Charts in Statistical Process Control
ASTM E 2382 : 2004 : R2012 Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E 2456 : 2006 Standard Terminology Relating to Nanotechnology
ASTM E 1617 : 2009 Standard Practice for Reporting Particle Size Characterization Data
ASTM E 1617 : 1997 : R2002 Standard Practice for Reporting Particle Size Characterization Data
ASTM E 2456 : 2006 : R2012 Standard Terminology Relating to Nanotechnology
ISO 18115-2:2013 Surface chemical analysis Vocabulary Part 2: Terms used in scanning-probe microscopy
ASTM E 2587 : 2012 Standard Practice for Use of Control Charts in Statistical Process Control
ASTM E 2587 : 2014 : EDT 1 Standard Practice for Use of Control Charts in Statistical Process Control
ASTM E 1617 : 1997 Standard Practice for Reporting Particle Size Characterization Data
ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

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