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ASTM E 666 : 2014

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
Available format(s)

Hardcopy , PDF

Superseded date

18-03-2021

Language(s)

English

Published date

25-02-2014

1.1This practice presents a technique for calculating the absorbed dose in a material from knowledge of the radiation field, the composition of the material, (1-5)2,3 and a related measurement. The procedure is applicable for X and gamma radiation provided the energy of the photons fall within the range from 0.01 to 20 MeV.

1.2A method is given for calculating the absorbed dose in a material from the knowledge of the absorbed dose in another material exposed to the same radiation field. The procedure is restricted to homogeneous materials composed of the elements for which absorption coefficients have been tabulated. All 92 natural elements are tabulated in (2). It also requires some knowledge of the energy spectrum of the radiation field produced by the source under consideration. Generally, the accuracy of this method is limited by the accuracy to which the energy spectrum of the radiation field is known.

1.3The results of this practice are only valid if charged particle equilibrium exists in the material and at the depth of interest. Thus, this practice is not applicable for determining absorbed dose in the immediate vicinity of boundaries between materials of widely differing atomic numbers. For more information on this topic, see Practice E1249.

1.4Energy transport computer codes4 exist that are formulated to calculate absorbed dose in materials more precisely than this method. To use these codes, more effort, time, and expense are required. If the situation warrants, such calculations should be used rather than the method described here.

1.5This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Committee
E 10
DocumentType
Standard Practice
Pages
9
PublisherName
American Society for Testing and Materials
Status
Superseded
SupersededBy
Supersedes

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ASTM F 1892 : 2012 : R2018 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
ASTM E 1249 : 2015 : R2021 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
ASTM E 2450 : 2016 Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
ASTM E 1894 : 2018 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
ASTM D 1879 : 2006 : R2014 Standard Practice for Exposure of Adhesive Specimens to Ionizing Radiation
ASTM F 980 : 2016 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
ASTM F 996 : 2011 : R2018 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics (Withdrawn 2023)
ASTM F 1467 : 2018 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

ASTM E 1249 : 2010 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
ASTM E 1249 : 2015 : R2021 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
ASTM E 1249 : 2000 : R2005 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
ASTM E 1249 : 2015 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
ASTM E 1249 : 2000 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources

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