1.1This guide covers procedures for determining the energy-differential fluence spectra of neutrons used in radiation-hardness testing of electronic semiconductor devices. The types of neutron sources specifically covered by this guide are fission or degraded energy fission sources used in either a steady-state or pulse mode.
1.2This guide provides guidance and criteria that can be applied during the process of choosing the spectrum adjustment methodology that is best suited to the available data and relevant for the environment being investigated.
1.3This guide is to be used in conjunction with Guide E720 to characterize neutron spectra and is used in conjunction with Practice E722 to characterize damage-related parameters normally associated with radiation-hardness testing of electronic-semiconductor devices.
Note 1:Although Guide E720 only discusses activation foil sensors, any energy-dependent neutron-responding sensor for which a response function is known may be used (1).
Note 2:For terminology used in this guide, see Terminology E170.
1.4The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.5This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.