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  • ASTM E 766 : 1998

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

    Available format(s):  Hardcopy, PDF

    Superseded date:  11-11-2014

    Language(s):  English

    Published date:  31-12-2010

    Publisher:  American Society for Testing and Materials

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    1.1 This practice is designed to calibrate the magnification of scanning electron microscopes (SEMs) using the National Institute of Standards and Technology (NIST) calibration specimen Standard Reference Material (SRM)484. Since the relationship between true magnification and magnification indicated on the SEM readout may be different at different magnifications, this practice must be applied to each magnification for which true magnification is desired.

    1.2 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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    Committee E 04
    Document Type Standard Practice
    Publisher American Society for Testing and Materials
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    ASTM E 384 : 2017 Standard Test Method for Microindentation Hardness of Materials
    ASTM E 986 : 2004 : R2017 Standard Practice for Scanning Electron Microscope Beam Size Characterization
    ASTM B 874 : 1996 : R2018 Standard Specification for Chromium Diffusion Coating Applied by Pack Cementation Process
    ASTM F 1877 : 2016 Standard Practice for Characterization of Particles
    ASTM B 748 : 1990 : R2016 Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
    ASTM E 2142 : 2008 : R2015 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
    ASTM E 2809 : 2013 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
    ASTM E 2627 : 2013 : R2019 Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
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