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ASTM F 1263 : 2011 : REDLINE

Current
Current

The latest, up-to-date edition.

Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Available format(s)

PDF

Language(s)

English

Published date

01-06-2011

CONTAINED IN VOL. 10.04, 2015 Deals with the use of overtesting so as to reduce the number of components that must be tested to meet a quality acceptance standard.

1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress level higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary, although exact knowledge may be replaced by over-conservative estimates of this distribution.

Committee
F 01
DocumentType
Redline
Pages
3
PublisherName
American Society for Testing and Materials
Status
Current

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