ASTM F 980 : 2016

Name: ASTM F 980 : 2016
Brand: ASTM
Price: 62.61 GBP

Superseded

View Superseded by

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

Available format(s)

Hardcopy , PDF

Superseded date

17-01-2024

Language(s)

English

Published date

06-09-2023

Publisher

American Society for Testing and Materials

1.1This guide defines the requirements and procedures for testing silicon discrete semiconductor devices and integrated circuits for rapid-annealing effects from displacement damage resulting from neutron radiation. This test will produce degradation of the electrical properties of the irradiated devices and should be considered a destructive test. Rapid annealing of displacement damage is usually associated with bipolar technologies.

1.1.1Heavy ion beams can also be used to characterize displacement damage annealing (1)2, but ion beams have significant complications in the interpretation of the resulting device behavior due to the associated ionizing dose. The use of pulsed ion beams as a source of displacement damage is not within the scope of this standard.

1.2The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to consult and establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Committee	E 10
DocumentType	Guide
Pages	7
PublisherName	American Society for Testing and Materials
Status	Superseded
SupersededBy	ASTM F 980 : 2016 : R2024
Supersedes	ASTM F 980 : 2010 : EDT 1

ASTM F 1190 : 2018

Standard Guide for Neutron Irradiation of Unbiased Electronic Components

ASTM E 1855 : 2005	Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E 1854 : 1996	Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
ASTM E 1855 : 2004	Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E 1855 : 2004 : EDT 1	Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E 1854 : 2005	Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
ASTM E 1855 : 2005 : EDT 1	Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E 264 : 2019	Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Nickel
ASTM E 1855 : 2015	Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E 720 : 2002	Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
ASTM E 1854 : 2003	Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
ASTM E 264 : 1992 : R1996	Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Nickel
ASTM E 721 : 2016	Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
ASTM E 1894 : 2013 : REV A	Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
ASTM E 1894 : 2018	Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
ASTM E 1855 : 2020	Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E 721 : 2022	Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
ASTM E 666 : 2021	Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
ASTM E 1854 : 2013	Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
ASTM E 1855 : 2010	Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E 1894 : 1997	Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
ASTM E 264 : 1992	Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Nickel
ASTM E 1894 : 2008	Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
ASTM E 1854 : 2019	Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
ASTM E 720 : 2016	Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
ASTM E 1854 : 2007	Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
ASTM E 1855 : 1996	Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E 720 : 1994	Standard Guide for Selection and Use of Neutron-Activation Foils for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
ASTM E 720 : 2023	Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
ASTM E 666 : 2014	Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation