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ASTM F 980 : 2016 : REDLINE

Current
Current

The latest, up-to-date edition.

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
Available format(s)

PDF

Language(s)

English

Published date

06-09-2023

Publisher

American Society for Testing and Materials

CONTAINED IN VOL. 10.04, 2017 Describes the requirements and procedures for testing silicon discrete semiconductor devices and integrated circuits for rapid-annealing effects from displacement damage resulting from neutron radiation.

1.1This guide defines the requirements and procedures for testing silicon discrete semiconductor devices and integrated circuits for rapid-annealing effects from displacement damage resulting from neutron radiation. This test will produce degradation of the electrical properties of the irradiated devices and should be considered a destructive test. Rapid annealing of displacement damage is usually associated with bipolar technologies.

1.1.1Heavy ion beams can also be used to characterize displacement damage annealing (1)2, but ion beams have significant complications in the interpretation of the resulting device behavior due to the associated ionizing dose. The use of pulsed ion beams as a source of displacement damage is not within the scope of this standard.

1.2The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to consult and establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Committee
E 10
DevelopmentNote
Supersedes ASTM F 980M. (02/2017)
DocumentType
Redline
Pages
7
PublisherName
American Society for Testing and Materials
Status
Current
Supersedes

MIL STD 11991 : A GENERAL STANDARD FOR PARTS, MATERIALS, AND PROCESSES
MIL-HDBK-817 Base Document:1994 SYSTEM DEVELOPMENT RADIATION HARDNESS ASSURANCE
ASTM E 1854 : 2013 : REDLINE Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
ASTM F 1190 : 2018 : REDLINE Standard Guide for Neutron Irradiation of Unbiased Electronic Components

ASTM E 720 : 2016 : REDLINE Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
ASTM E 1855 : 2015 : REDLINE Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E 265 : 2015 : REDLINE Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32
ASTM E 721 : 2016 : REDLINE Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
ASTM E 1854 : 2013 : REDLINE Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
ASTM E 722 : 2014 : REDLINE Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
ASTM E 666 : 2014 : REDLINE Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation

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