BS 6493-2.1:1985
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
Semiconductor devices. Integrated circuits General
Hardcopy , PDF
30-07-2002
English
06-08-2002
National foreword
Committees responsible
Chapter I: Scope and presentation of IEC Publication 748
1 Scope
2 Presentation
Chapter II: Purpose & presentation of Publication 748-1
1 General
2 Purpose
3 Presentation
Chapter III: Purpose, presentation and requirements on
the contents of publications 748-2, 748-3, etc. (under
consideration)
Chapter IV: Terminology, general
1 General terms
2 Types of devices
3 Clamping characteristics of integrated circuits
4 Technological concepts
5 Concepts for particular device types of film
integrated circuits and hybrid film integrated
circuits
Chapter V: Letter symbols, general
1 Basic letters
2 Subscripts for digital integrated circuits
2.1 Voltages and currents
2.2 Switching times
3 Subscripts for analogue integrated circuits
Chapter VI: Essential ratings and characteristics,
general
1 Introduction
2 Standard format for the presentation of published
data and method for describing essential ratings
and characteristics and function specification of
integrated circuits
2.1 Standard format for the presentation of published
data
2.2 Method for describing essential ratings and
characteristics and function specification of
integrated circuits
3 Basic "rating" definitions
4 Definitions of cooling conditions
5 List of preferred temperatures
6 List of preferred voltages
6.1 List of preferred nominal voltages for recommended
operating conditions
6.2 Tolerances on voltages
7 Mechanical ratings, characteristics and other data
8 Production spread and compliance
9 Printed wiring and printed circuits
Chapter VII: Measuring methods, general
1 Basic requirements
1.1 Introduction
1.2 General precautions
2 Specific requirements on the measuring methods
3 Numbering system for measuring methods
3.1 Numbering principle
3.2 Numbering list of measuring methods for integrated
circuits
3.3 Application matrices
3.4 Updating
Chapter VIII: Acceptance and reliability of integrated
circuits
Section One - General
Section Two - General principles
(under consideration)
Section Three - Electrical endurance tests
1 Purpose and presentation
2 General requirements
2.1 Conditions for electrical tests
2.2 Duration of test
2.3 Failure-defining characteristics and measurements
2.4 Failure criteria
2.5 Precautions
3 Specific requirements. General
3.1 List of endurance tests
3.2 Conditions for endurance tests
3.3 Failure-defining characteristics and failure
criteria for acceptance after endurance tests
3.4 Failure-defining characteristics and failure
criteria for reliability (under consideration)
3.5 Procedure in case of a testing error
Chapter IX: Electrostatic sensitive devices
(see Publication 747-1, Chapter IX)
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