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BS 9000(1967) : LATEST

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Superseded date

23-07-2013

Published date

23-11-2012

DocumentType
Standard
PublisherName
British Standards Institution
Status
Superseded

BS CECC40301 001-004(1977) : 1977 DETAIL SPECIFICATION FOR FIXED WIREWOUND INSULATED PRECISION RESISTORS - FULL ASSESSMENT LEVEL
BS CECC 90104:1981 Specification for harmonized system of quality assessment for electronic components. Family specification: C. Mos digital integrated circuits, series 4000B and 4000UB
BS QC 300203:1985 Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte and foil electrode. Assessment level E
BS CECC 75101:1984 Specification for harmonized system of quality assessment for electronic components. Example detail specification/blank detail specification. Two-part and edge socket connectors for printed board application
BS 9612 N018:1979 Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level
BS CECC 46001:1977 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cold cathode indicator tubes
BS QC 410101:1990 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Load screw actuated and rotary preset potentiometers. Assessment level E
BS 9305 N001:1972 Detail specification for silicon voltage regulator diodes. 1.5 W, 3.3 to 33 V (5%), hermetically sealed. General application category Q
BS 9940-03.01:1984 Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment Blank detail specification: fixed precision resistors. Assessment level E
BS QC 750103:1990 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification
BS 9301 N002:1971 Detail specification for general purpose silicon signal diodes. 150 mA, 150 V, hermetically sealed, glass encapsulation. General application category Q
BS 9070-4:1971 Specification for fixed capacitors of assessed quality: generic data and methods of test Polystyrene dielectric capacitors
BS 9130:1972 Specification for potentiometers of assessed quality: generic data and methods of test
BS 9751:1979 Blank detail specification for fixed insulated (unshielded) r.f. inductors at the full assessment level
BS 9364 N016:1979 Detail specification for low power silicon n-p-n switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level
BS CECC 30601:1980 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed ceramic dielectric capacitors, class 1
DEFSTAN 66-31/2(1991) : 1991 BASIC REQUIREMENTS AND TESTS FOR PROPRIETARY ELECTRONIC AND ELECTRICAL TEST EQUIPMENT
DEFSTAN 59-1(PT1)/1(1986) : 1986 AMD 1 1988 CRYSTAL UNITS, QUARTZ - PART 1: GENERAL REQUIREMENTS
BS 9305 N041:1972 Detail specification for silicon voltage regulator diodes. 400 mW, 2.7 to 33 V (5%), hermetically sealed, glass encapsulation. General application category Q
BS 9133 N001-003(1975) : 1975 DETAIL SPECIFICATION FOR SINGLE TURN LOW POWER NON-WIRE WOUND ROTARY POTENTIOMETERS - SPINDLE INSULATED FROM RESISTANCE ELEMENT, SPINDLE AND PANEL SEALED OR CONTAINER, SPINDLE AND PANEL SEALED - FULL ASSESSMENT LEVEL
BS 9612 N017:1979 Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level
BS 9751 N0001:1980 Detail specification for fixed insulated (unshielded) radio frequency inductors. Wire wound on ferrite, iron dust or phenolic cylindrical former. Full assessment level
BS EN 135000:1993 Harmonized system of quality assessment for electronic components. Generic specification: travelling wave amplifier tubes
BS 9070-1&2(1969) : 1969 AMD 7393 SPECIFICATION FOR FIXED CAPACITORS OF ASSESSED QUALITY: GENERIC DATA AND METHODS OF TEST - PRINCIPLES AND MANDATORY PROCEDURES - GENERAL RULES FOR DRAFTING DETAIL SPECIFICATIONS
BS QC 300202:1985 Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte and porous anode. Assessment level E
BS 9400:1970 Specification for integrated electronic circuits and micro-assemblies of assessed quality (qualification approval procedures): generic data and methods of test
BS QC 750110:1990 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Reverse blocking triode thyristors, ambient and case-rated, up to 100 A
BS 9133:1973 Rules for the preparation of detail specifications for single turn low power rotary potentiometers of assessed quality
BS 9925-01.01:1984 Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications Blank detail specification: magnetic oxide cores for inductor applications. Assessment level A
BS 9220:1971 Specification for rigid waveguide tubing of assessed quality: generic data and methods of test
BS 9150:1983 Specification for electrical relays of assessed quality: generic data and methods of test
BS 9041:1978 Rules for the preparation of detail specifications for gas filled microwave switching tubes of assessed quality: tunable and broadband TR tubes and TR limiters. Full assessment level
BS 9612 N021:1979 Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level
BS 9734:1978 Sectional specification for pulse transformers of assessed quality for use in electronic equipment: full assessment level
BS 9940-04.01:1984 Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment Blank detail specification: fixed resistor networks with individually measurable resistors all of equal value and equal dissipation. Assessment level E
BS QC 301201:1984 Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed metallized polypropylene film dielectric d.c. capacitors. Assessment level E
BS QC 960200:1992 Harmonized system of quality assessment for electronic components. Electromechanical switches for use in electronic equipment. Sectional specification for lever (toggle) switches
BS QC 960400:1992 Harmonized system of quality assessment for electronic components. Electromechanical switches for use in electronic equipment. Sectional specification for pushbutton switches
BS EN 125100:1993 Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for inductor applications
BS EN 150010:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient rated thyristors
BS 9054:1971 Rules for the preparation of detail specifications for radar display cathode ray tubes of assessed quality
BS 9121:1988 Blank detail specification for radio interference suppression filters of assessed quality. Basic and full assessment levels
BS 9753:1986 Sectional specification for variable r.f. type inductors of assessed quality for use in electronic equipment for capability approval
BS 9750:1990 Specification for fixed radio frequency inductors of assessed quality: generic data and methods of test
BS 9525 N0001:1982 Detail specification for multi-contact two-part printed board electrical connectors
BS 9733:1985 Sectional specification for pulse transformers of assessed quality for use in electronic equipment for capability approval
BS 9522 N0001:1982 Detail specification for multi-contact circular electrical connectors for d.c. and low frequency applications. Bayonet coupling with front release, rear removable crimp contacts. Full assessment level
BS CECC 90103:1983 Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS
BS CECC 41000:1977 Harmonized system of quality assessment for electronic components: generic specification for potentiometers
BS 9210:1984 Specification for radio frequency connectors of assessed quality: generic data and methods of test
BS 9741:1986 Sectional specification for inductors of assessed quality for use in electronic equipment for capability approval
BS 9727:1985 Sectional specification for power transformers of assessed quality for use in electronic equipment for capability approval
BS 9612 N016:1979 Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level
BS 9210-N001.1(1975) : 1975 DETAIL SPECIFICATION FOR RADIO FREQUENCY CONNECTORS (TYPE BNC) - SEALED, SOLDERED, CAPTIVE CONTACT, 50 OHMS - FULL ASSESSMENT LEVEL
BS EN 136001:1996 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: pulsed magnetrons (excluding frequency agile magnetrons)
BS 9070 N003:1971 Detail specification for fixed metallized mica dielectric capacitors (style C2AEA). Rectangular non-metallic case, axial wires at both ends. General application category
BS 9612 N005:1977 Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level
BS 9364 N013:1979 Detail specification for low power silicon p-n-p switching transistors. 25 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level
BS 6943:1988 Classification of shapes of electronic components for placement on printed wiring boards
BS 9925-02.01 & 02.02(1988) : 1988 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - INDUCTOR AND TRANSFORMER CORES FOR TELECOMMUNICATIONS - BLANK DETAIL SPECIFICATION: MAGNETIC OXIDE CORES FOR BROAD-BAND TRANSFORMERS - ASSESSMENT LEVELS A AND B
BS CECC 16100:1980 Harmonized system of quality assessment for electronic components. Sectional specification: electromechanical all-or-nothing relays
BS 9073 N0034:1978 Detail specification for fixed tantalum electrolytic capacitors. Porous anode, polar non-solid electrolyte. Tubular insulated metallic case, PTFE/elastomer seal, axial wire terminations. Full plus additional assessment level
BS 9612 N007:1977 Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level
BS 9612 N008:1977 Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level
BS 9090:1977 Variable capacitors of assessed quality: generic data and methods of test
BS QC 750108:1990 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A
BS 9521:1983 Specification for removable contacts of assessed quality for electrical connectors as defined by BS 9520: generic data, methods of test and rules for the preparation of detail specifications
BS 9131 N001-016(1974) : 1974 AMD 4679
BS 9031:1971 Rules for the preparation of detail specifications for pulsed fixed-frequency magnetrons of assessed quality
BS EN 136000:1993 Harmonized system of quality assessment for electronic components: generic specification: magnetrons
BS 9210-N007.1(1976) : 1976 DETAIL SPECIFICATION FOR RADIO FREQUENCY CONNECTORS (TYPE SMB) - UNSEALED, SOLDERED, CAPTIVE CONTACT, 50 OHMS, SNAP-ON COUPLINGS - FULL ASSESSMENT LEVEL
BS 9612 N020:1979 Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level
BS 9526 N0003:1979 Detail specification for multi-contact edge socket electrical connectors. Single or double sided, open ended, guide key location, replaceable contacts, through-board solder or wire wrap terminations. Full assessment level
BS QC 300401:1984 Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed metallized polyethylene terephthalate film dielectric d.c. capacitors. Assessment level E
BS 9925-02.0:1987 Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications Sectional specification: magnetic oxide cores for broad-band transformers
BS 9563:1979 Specification for rotary (manual) switches of assessed quality: generic data and methods of test; general rules for the preparation of detail specifications
BS 9520:1983 Specification for electrical connectors of assessed quality for d.c. and low frequency application: generic data, methods of test and capability approval procedures
BS 9522 N0003:1990 Detail specification for multi-contact circular electrical connectors for d.c. and low frequency applications. Bayonet couplingnon-barrier sealed, environment resistant with rear insertable, rear release, rear removable crimp contacts also barrier sealedwith non-removable solder contact styles. Full plus airframe fit assessment
BS 9074 N007:1981 Detail specification for polystyrene film dielectric capacitors, extended foil. Rectangular non-metallic case, unidirectional terminations. Full plus additional assessment level
BS 9522:1990 Rules for the preparation of detail specifications for circular electrical connectors of assessed quality for d.c. and low frequency applications. Full, basic and full plus airframe assessment levels
BS EN 135001:1997 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW power amplifier travelling wave tubes up to 500 watts
BS 9210 N0009-1:1978 Detail specification for radio frequency connectors (series SMC) Unsealed, soldered, captive contact, 50 Ω, screw coupling - Full assessment level
BS EN 111001:1996 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cathode ray tubes
BS 9076 N001-004(1974) : 1974 AMD 3815 DETAIL SPECIFICATION FOR FIXED METALLIZED POLYETHYLENE TEREPHTHALATE (PETP) FILM OR METALLIZED POLYCARBONATE FILM DIELECTRIC CAPACITORS - RECTANGULAR NON-METALLIC CASE AXIAL OR RADIAL TERMINATIONS, CENTRALLY SPACED - FULL ASSESSMENT LEVEL
BS 9075 N023:1978 Detail specification for fixed monolithic ceramic dielectric capacitors (type 1B). Rectangular non-metallic case, centred wires on one face. Full assessment level
BS 9612 N006:1977 Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, 47 U/2, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level
BS 9305 N042:1972 Detail specification for silicon voltage regulator diodes. 1.5 W, 6.8 to 200 V (5%), hermetically sealed. General application category C
BS 9561:1979 Specification for lever operated switches of assessed quality: generic data and methods of test; general rules for the preparation of detail specifications
BS 9100:1983 Specification for capability approval for custom-built capacitors and capacitor modules: generic data and methods of test
DEFSTAN 66-16/1(1975) : 1975 TEST SET, SAFETY, VOLTAGE DETECTION
BS 9364 N007 and N009:1978 Detail specification for low power silicon n-p-n switching transistors. 20 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level
BS QC 300201:1985 Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with solid electrolyte and porous anode. Assessment level E
BS 9070-7:1971 Specification for fixed capacitors of assessed quality: generic data and methods of test Mica dielectric capacitors
BS 9032:1975 Rules for the preparation of detail specifications for pulsed magnetrons (excluding frequency-agile magnetrons) of assessed quality. Basic assessment level
BS 9526 N0002:1979 Detail specification for multi-contact edge socket electrical connectors. Single or double sided, open ended, metal fixing flanges, guide key location, replaceable contacts, through-board solder or wire wrap terminations. Full assessment level
BS 9721:1985 Sectional specification for signal transformers of assessed quality for use in electronic equipment for capability approval
BS 9612 N019:1979 Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level
BS 9450:1975 Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures): generic data and methods of test
BS 9074 N002:1974 Detail specification for fixed polystyrene foil dielectric capacitors. Tubular insulated case, axial terminations. Full asessment level
BS EN 143004:1992 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (rod type)
BS 9564:1980 Specification for push-button switches of assessed quality: generic data and methods of test; general rules for the preparation of detail specifications
BS EN 143001:1992 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (beads in solid glass or vitreous enamel)
BS EN 116000-2:1994 Harmonized system of quality assessment for electronic components. Generic specification: electromechanical all-or-nothing relays Generic data and methods of test for time delay relays
BS 9526 N0001:1978 Detail specification for multi-contact edge socket electrical connectors. Single or double sided, closed ended, replaceable contacts, through-board solder or wire wrap terminations. Full assessment level
BS EN 143003:1992 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (disc type)
BS 9940-04.02:1984 Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment Blank detail specification: fixed resistor networks with individually measurable resistors of either different resistance values or different rated dissipations. Assessment level E
BS QC 400201:1993 Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed power resistors. Assessment level E
BS 9612 N009:1977 Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level
BS QC 750102:1990 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification
BS 9305 N044:1974 Detail specification for silicon voltage regulator diodes. 1.0 W, 3.3 to 33 V (5%), hermetically sealed. Full assessment level
BS 9612 N010:1979 Detail specification for cold welded seal quartz crystal units for oscillator applications. DK enclosure, 6.0 to 25 MHz frequency range. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level
BS 9075 N024:1978 Detail specification for fixed monolithic ceramic dielectric capacitors (type 2C1). Rectangular non-metallic case, centred wires on one face. Full assessment level
BS 9364 N011:1978 Detail specification for low power silicon p-n-p switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level
BS 9070 N002:1971 Detail specification for fixed metallized mica dielectric capacitors (style C2AED). Rectangular non-metallic case, centred wires on one face. General application category
BS 9070-5:1971 Specification for fixed capacitors of assessed quality: generic data and methods of test Ceramic dielectric capacitors
BS 9074 N007:1978 Detail specification for fixed polystyrene film dielectric extended foil capacitors. Rectangular non-metallic case, unidirectional terminations. Full plus additional assessment level
BS 9612 N004:1977 Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, 47 U/2, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level
BS QC 750104:1991 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications
BS 9925-03.01:1988 Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications Blank detail specification: magnetic oxide cores for transformers and chokes for power applications. Assessment level A
BS EN 136002:1996 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW magnetrons for RF heating or cooking applications
BS 7262:1990 Specification for automatic safe load indicators
BS EN 143002:1992 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (beads in envelopes)
BS 9070-6:1971 Specification for fixed capacitors of assessed quality: generic data and methods of test Polycarbonate dielectric capacitors and polyethylene terephthalate dielectric capacitors for d.c. use and polypropylene dielectric capacitors for d.c. and a.c. use
BS CECC 46000:1978 Harmonized system of quality assessment for electronic components: generic specification: cold cathode indicator tubes

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