BS CECC17000(1992) : 1992 AMD 9626

Name: BS CECC17000(1992) : 1992 AMD 9626
Brand: BSI

Superseded

View Superseded by

HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION - SOLID STATE ALL OR NOTHING RELAYS - GENERIC DATA AND METHODS OF TEST

Superseded date

15-10-1997

Published date

23-11-2012

Publisher

British Standards Institution

Foreword
Preface
Section 1 - Scope
Section 2 - General
2.1 Order of precedence
2.2 Related documents
2.3 Units, symbols and terminology
2.4 Preferred values
2.5 Marking
Section 3 - Terms and definitions
3.1 Construction
3.2 Type of relays
3.3 General terms
3.4 Prefixes for the values applicable to relays
3.5 Control signal values
3.6 Output values
3.7 Terms relating to times
Section 4 - Quality assessment procedures
4.1 Primary stage of manufacture
4.2 Structurally similar components
4.3 Qualification approval procedure
4.4 Quality conformance inspection
4.5 Division into groups
4.6 Resubmission of rejected lots
4.7 Certified test records
4.8 Delivery of relays subjected to tests
4.9 Delayed delivery
4.10 Supplementary procedures for deliveries
4.11 Unchecked parameters
4.12 Release for delivery before the completion of
       Group B tests
Section 5 - Test and measurement procedure
5.1 General
5.2 Alternative methods
5.3 Precision of measurement
5.4 Requirements in detail specifications
5.5 Standard conditions for testing
5.6 Visual inspection and check of dimensions
5.7 Mass
5.8 Terminal identification
5.9 'Must operate' and 'Must release' control signal
       current and voltage ION, VON, VO
5.10 Peak on-state voltage VTM
5.11 Zero turn-on voltage VTO
5.12 Surge (Non-repetitive) on-state current ITSM
5.13 Surge (Non-repetitive) on-state current ITSM
       (with rapid rate of rise of reverse voltage)
5.14 Critical rate of rise of on-state current dI/dt
5.15 Critical rate of rise of commutating voltage dV/dt
5.16 Critical rate of rise of off-state voltage dV/dt
5.17 Off-state current ID
5.18 Repetitive peak off-state voltage VDRM
5.19 Non-repetitive peak off-state voltage VDSM
5.20 Input circuit resistance
5.21 Dielectric test
5.22 Insulation resistance
5.23 Climatic sequence
5.24 Damp heat steady state
5.25 Rapid change of temperature
5.26 Accelerated thermal cycling
5.27 Enclosure
5.28 Corrosive atmosphere
5.29 Mould growth
5.30 Robustness of terminals
5.31 Soldering
5.32 Shock
5.33 Bump
5.34 Vibration
5.35 Acceleration
5.36 Electrical endurance
5.37 Thermal endurance
5.38 Voltage blocking
5.39 Resistance to solvents
5.40 Fire Hazard
5.41 Radio frequency interference (under consideration)

Lists measurement and test procedures to be used in sectional and/or detail specifications for solid state all or nothing relays, and specifies the quality assurance procedures to be followed. AMD 9626 RENUMBERS THIS STANDARD

Committee	ECL/1
DevelopmentNote	Renumbered and superseded by BS EN 117000. Supersedes 80/30638 DC. (08/2005)
DocumentType	Standard
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	BS EN 117000:1997

Standards	Relationship
CECC 17000 : 1990	Similar to

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