Customer Support: +44 (0)203 327 3140

Login to i2i Subscription Intertek.com
  • There are no items in your cart
We noticed you’re not on the correct regional site. Switch to our AMERICAS site for the best experience.
Go to AMERICAS site
Dismiss alert
Please enter a keyword to search
Advanced search

BS CECC50001(1981) : 1981 AMD 7590

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: GENERAL PURPOSE SEMICONDUCTOR DIODES
Superseded date

15-02-1993

Published date

06-12-2012

Publisher

British Standards Institution

Gives ratings, characteristics and inspection requirements to be included as mandatory requirements in accordance with BS CECC 50000 in any detail specification for these devices. BS AMD 7590 renumbers this standard to BS EN 150001

Committee
ECL/24
DevelopmentNote
Renumbered and superseded by BS EN 150001. Supersedes BS E9371(1975). (09/2005)
DocumentType
Standard
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
CECC 50001 : 1980 Identical

BS EN 150007:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for high frequency amplification
BS EN 150003:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for low frequency amplification
BS EN 150004:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: bipolar transistors for switching applications
BS EN 150006:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Variable capacitance diode(s)
BS E9375:1975 Specification. Harmonized system of quality assessment for electronic components. Blank detail specification: voltage regulator diodes and voltage reference diodes excluding precision-voltage temperature-compensated reference diodes
BS E9372:1976 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated bipolar transistors for low and high frequency amplification

IEC 60191-2:2012 DB Mechanical standardization of semiconductor devices - Part 2: Dimensions
CECC 50000 : 86 AMD 3 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION FOR DISCRETE SEMICONDUCTOR DEVICES

View more information
Sorry this product is not available in your region.

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.

Learn more on subscription solutions

or

Get in touch with us