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BS CECC 64000:1990

Withdrawn
Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Harmonized system of quality assessment for electronic components: generic specification: film resistor networks
Available format(s)

Hardcopy , PDF

Withdrawn date

15-11-1997

Language(s)

English

Published date

30-04-1990

Publisher

British Standards Institution

Foreword
Preface
Section 1
1.1 Scope
1.2 Technological classification of Film Resistor
       Networks
Section 2 - General
2.1 Order of precedence
2.2 Related documents
2.3 Units, symbols and terminology
2.4 Preferred values
2.5 Marking
2.6 Coding
Section 3 - Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Manufacturing stages and sub-contracting
3.3 Manufacturer approval
3.4 Approval of fixed resistor networks
3.5 Qualification approval
3.6 Capability approval
3.7 Certified test records
3.8 Delayed deliveries
3.9 Delivery of networks subjected to destructive
       or non destructive tests
3.10 Supplementary procedure for delivery
3.11 Supplementary information
Section 4 - Test and measurements procedures
4.1 General
4.2 Standard conditions for testing
4.3 Visual examination and check of dimensions
4.4 Electrical measurement procedures
4.5 Environmental testing procedure

Defines the terms, inspection procedures and methods of test for use in sectional and detailed specifications for qualification and capability approval of fixed resistors.

Committee
W/-
DevelopmentNote
Being replaced by the BS EN 165000 series.
DocumentType
Standard
Pages
48
PublisherName
British Standards Institution
Status
Withdrawn

Standards Relationship
CECC 64000 : 1988 Identical

CECC 00107(PT3) : 80 AMD 1 CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - PROCEDURE FOR CAPABILITY APPROVAL
IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
CECC 00100 : 1988 BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V
IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
IEC 60410:1973 Sampling plans and procedures for inspection by attributes
IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
CECC 00107(PT1) : 1982 CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - QUALITY ASSESSMENT PROCEDURE FOR GENERAL USAGE
IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
IEC TR 60440:1973 Method of measurement of non-linearity in resistors
IEC 60062:2016 Marking codes for resistors and capacitors
IEC 60063:2015 Preferred number series for resistors and capacitors
IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
CECC 00007 : 1978 BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES
IEC 60191-3:1999 Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits
IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)

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Hardcopy - English
PDF - English
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